Irradiation effects in electronic components of the RPC Trigger for the CMS Experiment

Karol Bunkowski, Ivan Kassamakov, J Krolikowski, Krzysztof Kierzkowski, Maciej Ignacy Kudla, Teppo Maenpaa, Krzysztof T. Pozniak, Dominik Rybka, Eija Tuominen, Donatella Ungaro, Wojciech M. Zabolotny

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)

Abstract

The results of proton radiation test of electronic devices for RPC trigger electronic system of CMS detector are presented. For Xilinx Spartan-IIE FPGA the cross section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops was also investigated, but not observed. For the FLASH memories no single upsets were detected, but after a huge dose permanent damages of devices were observed. For SDRAM memories, the SEU cross section was measured. A brief description of radiation inducted effects in FPGAs, SRAM and FLASH memories is also presented.
Original languageEnglish
Title of host publicationPhotonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II
PublisherInternational Society for Optics and Photonics SPIE
ISBN (Print)0-8194-5415-X
DOIs
Publication statusPublished - 2004
MoE publication typeA4 Article in a conference publication

Publication series

SeriesProceedings of SPIE
Volume5484
ISSN0277-786X

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