Iterative algorithm for quantitative FTIR-PAS depth profiling

Janne Paaso, Jussi Tenhunen, Mari Halttunen, Per Stenius, Jouni Tornberg

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the Northern Optics 2000 and EOSAM 2000
    EditorsKlaus Biedermann, Ulf Olin
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication
    EventNorthern Optics 2000, NO 2000 - Uppsala, Sweden
    Duration: 6 Jun 20008 Jun 2000

    Conference

    ConferenceNorthern Optics 2000, NO 2000
    CountrySweden
    CityUppsala
    Period6/06/008/06/00

    Cite this

    Paaso, J., Tenhunen, J., Halttunen, M., Stenius, P., & Tornberg, J. (2000). Iterative algorithm for quantitative FTIR-PAS depth profiling. In K. Biedermann, & U. Olin (Eds.), Proceedings of the Northern Optics 2000 and EOSAM 2000 [172]