Kinetics of the growth and restructuring of the oxide layer on stainless steel in a light water reactor coolant

Martin Bojinov, Petri Kinnunen

Research output: Chapter in Book/Report/Conference proceedingChapter or book articleProfessional

Abstract

The oxide films formed on AISI 316L(NG) in the temperature range 150-300°C in a simulated light water reactor coolant have been characterised by impedance spectroscopy and ex-situ analysis using Auger electron spectroscopy. The results show that the nature of the barrier layer does not change drastically with temperature, although the growth mechanism of the oxide film is different at 150.300 C than at room temperature. The ability of the Mixed-Conduction Model for passive films to reproduce the experimental impedance data has been tested. A procedure for the calculation of the kinetic constants of the interfacial reactions, as well as the diffusion coefficients of ionic / electronic defects in the oxide has been developed. The effect of temperature on the parameters has been quantified, and their relevance for the corrosion behaviour of stainless steel in a high-temperature electrolyte is discussed.
Original languageEnglish
Title of host publicationSAFIR, The Finnish Research Programme on Nuclear Power Plant Safety 2003 - 2006
Subtitle of host publicationInterim Report
Place of PublicationEspoo
PublisherVTT Technical Research Centre of Finland
Pages89-97
ISBN (Electronic)951-38-6516-9
ISBN (Print)951-38-6515-0
Publication statusPublished - 2004
MoE publication typeD2 Article in professional manuals or guides or professional information systems or text book material

Publication series

SeriesVTT Tiedotteita - Research Notes
Number2272
ISSN1235-0605

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    Bojinov, M., & Kinnunen, P. (2004). Kinetics of the growth and restructuring of the oxide layer on stainless steel in a light water reactor coolant. In SAFIR, The Finnish Research Programme on Nuclear Power Plant Safety 2003 - 2006: Interim Report (pp. 89-97). VTT Technical Research Centre of Finland. VTT Tiedotteita - Research Notes, No. 2272 http://www.vtt.fi/inf/pdf/tiedotteet/2004/T2272.pdf