Laser interferometric measurement and Fourier transformation techniques have been used to extract the dispersion characteristics of a mirror (SMR) type thin film bulk acoustic wave resonator (FBAR). A numerically robust matrix method incorporating anisotropic materials and piezoelectricity has been used to calculate the dispersion curves based on information of the layer thicknesses and material parameters of individual layers. A fit has been performed between the measured and simulated curves thereby allowing the extraction of the material parameters of the ZnO piezolayer. We present the set of material parameters resulting from the fitting.
|Series||Proceedings - IEEE Ultrasonics Symposium|
|Conference||2002 IEEE International Ultrasonics Symposium and Short Courses|
|Period||8/10/02 → 11/10/02|