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Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry

  • Alessandro Crippa*
  • , Romain Maurand
  • , Dharmraj Kotekar-Patil
  • , Andrea Corna
  • , Heorhii Bohuslavskyi
  • , Alexei O. Orlov
  • , Patrick Fay
  • , Romain Laviéville
  • , Sylvain Barraud
  • , Maud Vinet
  • , Marc Sanquer
  • , Silvano De Franceschi
  • , Xavier Jehl
    • *Corresponding author for this work
  • University of Milano-Bicocca
  • Institute for microelectronics and microsystems (IMM-CNR)
  • University of Notre Dame
  • Institute for Nanoscience and Cryogenics (INAC)
  • Laboratoire d'électronique des technologies de l'information (LETI)

Research output: Contribution to journal › Article › Scientific › peer-review

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