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LIBS depth profiling of Be-containing samples with different gaseous impurity concentrations
P. G. Bhat, P. Veis*, A. Marín Roldán, Juuso Karhunen, P. Paris, I. Jõgi, Antti Hakola, Jari Likonen, S. Almaviva, W. Gromelski, M. Ladygina, P. Gasior, J. Ristkok, I. Bogdanović Radović, Z. Siketić, O. Romanenko, C. Porosnicu, C. Lungu
*Corresponding author for this work
- Comenius University in Bratislava
- University of Tartu
- National Agency for New Technologies, Energy and Sustainable Economic Development (ENEA)
- Institute of Plasma Physics and Laser Microfusion (IPPLM/IFPILM)
- Ruđer Bošković Institute (IRB)
- Czech Academy of Sciences
- National Institute for Lasers, Plasma and Radiation Physics (INFLPR)
Research output: Contribution to journal › Article › Scientific › peer-review
6
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(Scopus)