Abstract
The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (V-band) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.
Original language | English |
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Title of host publication | Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 1-4 |
ISBN (Electronic) | 978-1-5090-1348-7 |
DOIs | |
Publication status | Published - 30 Jun 2016 |
MoE publication type | A4 Article in a conference publication |
Event | 2016 Global Symposium on Millimeter Waves, GSMM 2016 and ESA Workshop on Millimetre-Wave Technology and Applications - Aalto University, Espoo, Finland Duration: 6 Jun 2016 → 8 Jun 2016 |
Conference
Conference | 2016 Global Symposium on Millimeter Waves, GSMM 2016 and ESA Workshop on Millimetre-Wave Technology and Applications |
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Abbreviated title | GSMM 2016 |
Country/Territory | Finland |
City | Espoo |
Period | 6/06/16 → 8/06/16 |
Other | The main theme of the joint conference is MILLIMETER-WAVE AND TERAHERTZ SENSING AND COMMUNICATIONS. It covers millimeterwave and THz antennas, circuits, devices, systems and applications. |
Keywords
- reliability engineering
- millimeter wave integrated circuits
- MIMICs
- MMICs
- low-noise amplifiers
- millimeter wave transistors
- integrated circuit reliability
- materials reliability