LNA module reliability testing for the MetOp Second Generation satellites

Mikko Kärkkäinen, Mikko Kantanen, Ari Alanne, Jarkko Viitanen, Petri Jukkala, Markus Rösch, Arnulf Leuther, Marie Genevieve Perichaud, Ville Kangas

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Abstract

The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (V-band) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.
Original languageEnglish
Title of host publicationMillimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on
PublisherInstitute of Electrical and Electronic Engineers IEEE
Pages1-4
ISBN (Electronic)978-1-5090-1348-7
DOIs
Publication statusPublished - 30 Jun 2016
MoE publication typeA4 Article in a conference publication
Event2016 Global Symposium on Millimeter Waves, GSMM 2016 and ESA Workshop on Millimetre-Wave Technology and Applications - Aalto University, Espoo, Finland
Duration: 6 Jun 20168 Jun 2016

Conference

Conference2016 Global Symposium on Millimeter Waves, GSMM 2016 and ESA Workshop on Millimetre-Wave Technology and Applications
Abbreviated titleGSMM 2016
CountryFinland
CityEspoo
Period6/06/168/06/16
OtherThe main theme of the joint conference is MILLIMETER-WAVE AND TERAHERTZ SENSING AND COMMUNICATIONS. It covers millimeterwave and THz antennas, circuits, devices, systems and applications.

Fingerprint

Satellites
Testing
Low noise amplifiers
Image sensors
Acoustic waves
Detectors

Keywords

  • reliability engineering
  • millimeter wave integrated circuits
  • MIMICs
  • MMICs
  • low-noise amplifiers
  • millimeter wave transistors
  • integrated circuit reliability
  • materials reliability

Cite this

Kärkkäinen, M., Kantanen, M., Alanne, A., Viitanen, J., Jukkala, P., Rösch, M., ... Kangas, V. (2016). LNA module reliability testing for the MetOp Second Generation satellites. In Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on (pp. 1-4). Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/GSMM.2016.7500334
Kärkkäinen, Mikko ; Kantanen, Mikko ; Alanne, Ari ; Viitanen, Jarkko ; Jukkala, Petri ; Rösch, Markus ; Leuther, Arnulf ; Perichaud, Marie Genevieve ; Kangas, Ville. / LNA module reliability testing for the MetOp Second Generation satellites. Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on. Institute of Electrical and Electronic Engineers IEEE, 2016. pp. 1-4
@inproceedings{13a5d8f4dcba4eaa91eb241e7ce4e331,
title = "LNA module reliability testing for the MetOp Second Generation satellites",
abstract = "The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (V-band) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.",
keywords = "reliability engineering, millimeter wave integrated circuits, MIMICs, MMICs, low-noise amplifiers, millimeter wave transistors, integrated circuit reliability, materials reliability",
author = "Mikko K{\"a}rkk{\"a}inen and Mikko Kantanen and Ari Alanne and Jarkko Viitanen and Petri Jukkala and Markus R{\"o}sch and Arnulf Leuther and Perichaud, {Marie Genevieve} and Ville Kangas",
note = "Project : 80781",
year = "2016",
month = "6",
day = "30",
doi = "10.1109/GSMM.2016.7500334",
language = "English",
pages = "1--4",
booktitle = "Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on",
publisher = "Institute of Electrical and Electronic Engineers IEEE",
address = "United States",

}

Kärkkäinen, M, Kantanen, M, Alanne, A, Viitanen, J, Jukkala, P, Rösch, M, Leuther, A, Perichaud, MG & Kangas, V 2016, LNA module reliability testing for the MetOp Second Generation satellites. in Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on. Institute of Electrical and Electronic Engineers IEEE, pp. 1-4, 2016 Global Symposium on Millimeter Waves, GSMM 2016 and ESA Workshop on Millimetre-Wave Technology and Applications, Espoo, Finland, 6/06/16. https://doi.org/10.1109/GSMM.2016.7500334

LNA module reliability testing for the MetOp Second Generation satellites. / Kärkkäinen, Mikko; Kantanen, Mikko; Alanne, Ari; Viitanen, Jarkko; Jukkala, Petri; Rösch, Markus; Leuther, Arnulf; Perichaud, Marie Genevieve; Kangas, Ville.

Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on. Institute of Electrical and Electronic Engineers IEEE, 2016. p. 1-4.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

TY - GEN

T1 - LNA module reliability testing for the MetOp Second Generation satellites

AU - Kärkkäinen, Mikko

AU - Kantanen, Mikko

AU - Alanne, Ari

AU - Viitanen, Jarkko

AU - Jukkala, Petri

AU - Rösch, Markus

AU - Leuther, Arnulf

AU - Perichaud, Marie Genevieve

AU - Kangas, Ville

N1 - Project : 80781

PY - 2016/6/30

Y1 - 2016/6/30

N2 - The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (V-band) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.

AB - The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (V-band) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.

KW - reliability engineering

KW - millimeter wave integrated circuits

KW - MIMICs

KW - MMICs

KW - low-noise amplifiers

KW - millimeter wave transistors

KW - integrated circuit reliability

KW - materials reliability

U2 - 10.1109/GSMM.2016.7500334

DO - 10.1109/GSMM.2016.7500334

M3 - Conference article in proceedings

SP - 1

EP - 4

BT - Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on

PB - Institute of Electrical and Electronic Engineers IEEE

ER -

Kärkkäinen M, Kantanen M, Alanne A, Viitanen J, Jukkala P, Rösch M et al. LNA module reliability testing for the MetOp Second Generation satellites. In Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on. Institute of Electrical and Electronic Engineers IEEE. 2016. p. 1-4 https://doi.org/10.1109/GSMM.2016.7500334