LNA module reliability testing for the MetOp Second Generation satellites

Mikko Kärkkäinen, Mikko Kantanen, Ari Alanne, Jarkko Viitanen, Petri Jukkala, Markus Rösch, Arnulf Leuther, Marie Genevieve Perichaud, Ville Kangas

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    1 Citation (Scopus)

    Abstract

    The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (V-band) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.
    Original languageEnglish
    Title of host publicationMillimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages1-4
    ISBN (Electronic)978-1-5090-1348-7
    DOIs
    Publication statusPublished - 30 Jun 2016
    MoE publication typeA4 Article in a conference publication
    Event2016 Global Symposium on Millimeter Waves, GSMM 2016 and ESA Workshop on Millimetre-Wave Technology and Applications - Aalto University, Espoo, Finland
    Duration: 6 Jun 20168 Jun 2016

    Conference

    Conference2016 Global Symposium on Millimeter Waves, GSMM 2016 and ESA Workshop on Millimetre-Wave Technology and Applications
    Abbreviated titleGSMM 2016
    CountryFinland
    CityEspoo
    Period6/06/168/06/16
    OtherThe main theme of the joint conference is MILLIMETER-WAVE AND TERAHERTZ SENSING AND COMMUNICATIONS. It covers millimeterwave and THz antennas, circuits, devices, systems and applications.

    Fingerprint

    Satellites
    Testing
    Low noise amplifiers
    Image sensors
    Acoustic waves
    Detectors

    Keywords

    • reliability engineering
    • millimeter wave integrated circuits
    • MIMICs
    • MMICs
    • low-noise amplifiers
    • millimeter wave transistors
    • integrated circuit reliability
    • materials reliability

    Cite this

    Kärkkäinen, M., Kantanen, M., Alanne, A., Viitanen, J., Jukkala, P., Rösch, M., ... Kangas, V. (2016). LNA module reliability testing for the MetOp Second Generation satellites. In Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on (pp. 1-4). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/GSMM.2016.7500334
    Kärkkäinen, Mikko ; Kantanen, Mikko ; Alanne, Ari ; Viitanen, Jarkko ; Jukkala, Petri ; Rösch, Markus ; Leuther, Arnulf ; Perichaud, Marie Genevieve ; Kangas, Ville. / LNA module reliability testing for the MetOp Second Generation satellites. Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on. IEEE Institute of Electrical and Electronic Engineers , 2016. pp. 1-4
    @inproceedings{13a5d8f4dcba4eaa91eb241e7ce4e331,
    title = "LNA module reliability testing for the MetOp Second Generation satellites",
    abstract = "The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (V-band) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.",
    keywords = "reliability engineering, millimeter wave integrated circuits, MIMICs, MMICs, low-noise amplifiers, millimeter wave transistors, integrated circuit reliability, materials reliability",
    author = "Mikko K{\"a}rkk{\"a}inen and Mikko Kantanen and Ari Alanne and Jarkko Viitanen and Petri Jukkala and Markus R{\"o}sch and Arnulf Leuther and Perichaud, {Marie Genevieve} and Ville Kangas",
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    doi = "10.1109/GSMM.2016.7500334",
    language = "English",
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    Kärkkäinen, M, Kantanen, M, Alanne, A, Viitanen, J, Jukkala, P, Rösch, M, Leuther, A, Perichaud, MG & Kangas, V 2016, LNA module reliability testing for the MetOp Second Generation satellites. in Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on. IEEE Institute of Electrical and Electronic Engineers , pp. 1-4, 2016 Global Symposium on Millimeter Waves, GSMM 2016 and ESA Workshop on Millimetre-Wave Technology and Applications, Espoo, Finland, 6/06/16. https://doi.org/10.1109/GSMM.2016.7500334

    LNA module reliability testing for the MetOp Second Generation satellites. / Kärkkäinen, Mikko; Kantanen, Mikko; Alanne, Ari; Viitanen, Jarkko; Jukkala, Petri; Rösch, Markus; Leuther, Arnulf; Perichaud, Marie Genevieve; Kangas, Ville.

    Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on. IEEE Institute of Electrical and Electronic Engineers , 2016. p. 1-4.

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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    AU - Kantanen, Mikko

    AU - Alanne, Ari

    AU - Viitanen, Jarkko

    AU - Jukkala, Petri

    AU - Rösch, Markus

    AU - Leuther, Arnulf

    AU - Perichaud, Marie Genevieve

    AU - Kangas, Ville

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    AB - The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (V-band) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.

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    KW - millimeter wave integrated circuits

    KW - MIMICs

    KW - MMICs

    KW - low-noise amplifiers

    KW - millimeter wave transistors

    KW - integrated circuit reliability

    KW - materials reliability

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    PB - IEEE Institute of Electrical and Electronic Engineers

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    Kärkkäinen M, Kantanen M, Alanne A, Viitanen J, Jukkala P, Rösch M et al. LNA module reliability testing for the MetOp Second Generation satellites. In Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications, 2016 Global Symposium on. IEEE Institute of Electrical and Electronic Engineers . 2016. p. 1-4 https://doi.org/10.1109/GSMM.2016.7500334