Long hold times in a two-junction electron trap

Antti Kemppinen (Corresponding Author), S.V. Lotkhov, O.-P. Saira, A.B. Zorin, J.P. Pekola, Antti J. Manninen

Research output: Contribution to journalArticleScientificpeer-review

15 Citations (Scopus)

Abstract

The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistor R ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.
Original languageEnglish
Article number142106
Number of pages3
JournalApplied Physics Letters
Volume99
Issue number14
DOIs
Publication statusPublished - 2011
MoE publication typeA1 Journal article-refereed

Keywords

  • electrometers
  • tunneling
  • electroluminescence
  • photoacoustic imaging
  • resistors

Fingerprint Dive into the research topics of 'Long hold times in a two-junction electron trap'. Together they form a unique fingerprint.

  • Cite this