Long hold times in a two-junction electron trap

Antti Kemppinen; S.V. Lotkhov; O.-P. Saira; A.B. Zorin; J.P. Pekola; Antti J. Manninen

doi:10.1063/1.3647557

Long hold times in a two-junction electron trap

Antti Kemppinen^*, S.V. Lotkhov, O.-P. Saira, A.B. Zorin, J.P. Pekola, Antti J. Manninen

^*Corresponding author for this work

SU1202 Electrical metrology

Research output: Contribution to journal › Article › Scientific › peer-review

18 Citations (Scopus)

Abstract

The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistor R ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.

Original language	English
Article number	142106
Number of pages	3
Journal	Applied Physics Letters
Volume	99
Issue number	14
DOIs	https://doi.org/10.1063/1.3647557
Publication status	Published - 2011
MoE publication type	A1 Journal article-refereed

Keywords

electrometers
tunneling
electroluminescence
photoacoustic imaging
resistors

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10.1063/1.3647557

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title = "Long hold times in a two-junction electron trap",

abstract = "The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistor R ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.",

keywords = "electrometers, tunneling, electroluminescence, photoacoustic imaging, resistors",

author = "Antti Kemppinen and S.V. Lotkhov and O.-P. Saira and A.B. Zorin and J.P. Pekola and Manninen, {Antti J.}",

year = "2011",

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journal = "Applied Physics Letters",

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T1 - Long hold times in a two-junction electron trap

AU - Kemppinen, Antti

AU - Lotkhov, S.V.

AU - Saira, O.-P.

AU - Zorin, A.B.

AU - Pekola, J.P.

AU - Manninen, Antti J.

PY - 2011

Y1 - 2011

N2 - The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistor R ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.

AB - The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistor R ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.

KW - electrometers

KW - tunneling

KW - electroluminescence

KW - photoacoustic imaging

KW - resistors

U2 - 10.1063/1.3647557

DO - 10.1063/1.3647557

M3 - Article

SN - 0003-6951

VL - 99

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 14

M1 - 142106

ER -

Long hold times in a two-junction electron trap

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Keywords

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