Abstract
The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistor R ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.
| Original language | English |
|---|---|
| Article number | 142106 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 99 |
| Issue number | 14 |
| DOIs | |
| Publication status | Published - 2011 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- electrometers
- tunneling
- electroluminescence
- photoacoustic imaging
- resistors
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