Low Energy Electron Beam Induced Damage on Gallium Nitride Based Structures

Research output: Contribution to conference › Conference article › Scientific › peer-review

Original language	English
Publication status	Published - 2011
MoE publication type	Not Eligible
Event	16th Semiconducting and Insulating Materials Conference (SIMC-XVI) - Stockholm, Sweden Duration: 19 Jun 2011 → 23 Jun 2011

Conference	16th Semiconducting and Insulating Materials Conference (SIMC-XVI)
Country/Territory	Sweden
City	Stockholm
Period	19/06/11 → 23/06/11

Cite this

@conference{ffe9cf8a874a4e73af0be4419fc3b7bd,

title = "Low Energy Electron Beam Induced Damage on Gallium Nitride Based Structures",

author = "Henri Nyk{\"a}nen and P{\"a}ivi Mattila and Sami Suihkonen and Juha Riikonen and Estelle Homeyer and Joel Bellessa and Markku Sopanen",

year = "2011",

language = "English",

note = "16th Semiconducting and Insulating Materials Conference (SIMC-XVI) ; Conference date: 19-06-2011 Through 23-06-2011",

}

TY - CONF

T1 - Low Energy Electron Beam Induced Damage on Gallium Nitride Based Structures

AU - Nykänen, Henri

AU - Mattila, Päivi

AU - Suihkonen, Sami

AU - Riikonen, Juha

AU - Homeyer, Estelle

AU - Bellessa, Joel

AU - Sopanen, Markku

PY - 2011

Y1 - 2011

M3 - Conference article

T2 - 16th Semiconducting and Insulating Materials Conference (SIMC-XVI)

Y2 - 19 June 2011 through 23 June 2011

ER -