Abstract
This paper presents a low temperature (200°C)
CMOS-compatible fabrication process for integrating
high-temperature deposited lead zirconate titanate (PZT)
on thin film monocrystalline-silicon piezoelectric
actuators, onto an RF substrate, and successful
demonstration of this process for fabrication of
metal-contact RF-MEMS switches. The patterned PZT/silicon
multi-layer stack is transfer-bonded from a
silicon-on-insulator (SOI) donor wafer to an AF-45 glass
RF substrate using adhesive wafer transfer bonding.
Furthermore, several strategies have been investigated to
drastically reduce the post bonding misalignment created
by the shear forces between the bonding chucks during
wafer bonding. (9 refs.)
Original language | English |
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Title of host publication | Proceedings |
Subtitle of host publication | 23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010 |
Place of Publication | Piscataway, NJ, USA |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 47-50 |
ISBN (Electronic) | 978-1-4244-5764-9 |
ISBN (Print) | 978-1-4244-5761-8 |
DOIs | |
Publication status | Published - 2010 |
MoE publication type | A4 Article in a conference publication |
Event | IEEE 23rd International Conference on Micro Electro Mechanical Systems, MEMS 2010 - Wanchai, Hong Kong, China Duration: 24 Jan 2010 → 28 Jan 2010 |
Conference
Conference | IEEE 23rd International Conference on Micro Electro Mechanical Systems, MEMS 2010 |
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Abbreviated title | MEMS 2010 |
Country/Territory | China |
City | Wanchai, Hong Kong |
Period | 24/01/10 → 28/01/10 |