INIS
layers
100%
plasma
100%
low temperature
100%
deposition
100%
films
100%
carbon dioxide
100%
growth
60%
moisture
40%
density
40%
precursor
40%
residual stresses
40%
oxygen
40%
levels
20%
carbon
20%
concentration
20%
detection
20%
hydrogen
20%
impurities
20%
optical properties
20%
chemical composition
20%
oxidants
20%
wavelengths
20%
nitrogen
20%
refractive index
20%
time-of-flight method
20%
recoils
20%
silanes
20%
Keyphrases
Carbon Dioxide
100%
Silica
100%
SiO2 Film
100%
Plasma-enhanced Atomic Layer Deposition (PEALD)
100%
Low-temperature Plasma
100%
Moisture
50%
Oxygen Sensitivity
50%
Residual Stress
25%
Atomic Layer Deposition
25%
Optical Properties
25%
Chemical Composition
25%
Growth per Cycle
25%
Refractive Index
25%
Time-of-flight Elastic Recoil Detection Analysis
25%
Carbon Content
25%
Silane
25%
Impurity Levels
25%
Bulk Concentration
25%
Tensile Residual Stress
25%
Engineering
Low-Temperature
100%
Sio2 Film
100%
Temperature Plasma
100%
Atomic Layer Deposition
100%
Time-of-Flight
25%
Tensile Residual Stress
25%
Residual Stress
25%
Optical Density
25%
Bulk Concentration
25%
Deposition Process
25%
Refractive Index
25%
Impurity Level
25%
Material Science
Film
100%
Carbon Dioxide
100%
Residual Stress
40%
Density
40%
Silane
20%
Refractive Index
20%
Optical Property
20%
Oxidant
20%
Chemical Engineering
Atomic Layer Deposition
100%
Carbon Dioxide
100%
Silane
33%