Magnetic Czochralski silicon strip detectors for Super-LHC experiments

Esa Tuovinen (Corresponding Author), Jaakko Härkönen, Panja Luukka, Teppo Mäenpää, Henri Moilanen, Ivan Kassamakov, Eija Tuominen

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Abstract

High resistivity and high oxygen concentration of silicon wafers can be beneficial for the radiation hardness of silicon detectors. Wafers of Magnetic Czochralski silicon (MCz-Si) can be grown with a resistivity of a few kΩcm and with well-controlled, high oxygen concentration. According to the beam test results presented in this paper, n-type MCz-Si bulk, p-strip readout detectors with can be operated with acceptable signal-to-noise ratio up to the irradiation fluence of 1×1015 cm-2 1-MeV neutron equivalent. The improved radiation hardness compared to that of traditional p-in-n Float Zone silicon (p-in-n FZ-Si) detectors can be explained by better electric field distribution inside MCz-Si detectors. The difference between the distributions is clearly shown by Transient Current Technique (TCT) measurements, presented in this paper. Thus, strip detectors made on n-type MCz-Si are a feasible option for the outer tracker layers of the potential upgrade of the Large Hadron Collider (LHC), the Super-LHC. This corresponds approximately 95% of the total area of silicon detectors in the Super-LHC.

Original languageEnglish
Pages (from-to)S79-S82
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume636
Issue number1 SUPPL.
DOIs
Publication statusPublished - 21 Apr 2011
MoE publication typeA1 Journal article-refereed

Keywords

  • Beam tests
  • Particle detectors
  • Radiation hardness
  • Silicon
  • Transient current technique

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