Abstract
Transmission and back reflection X‐ray topographs of a large near (100) Fe‐3 wt% Si subgrain compressed along an easy surface direction of magnetization are taken with white synchrotron radiation. Disappearance of the [001] stripe domain contrast is observed only in the 001 transmission topograph. High resolution back reflection topographs reveal a zig‐zag fine structure of the stripes. A domain model to explain the results is presented.
| Original language | English |
|---|---|
| Pages (from-to) | 495-500 |
| Journal | Physica Status Solidi A: Applied Research |
| Volume | 58 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 1980 |
| MoE publication type | A1 Journal article-refereed |
Fingerprint
Dive into the research topics of 'Magnetic domain wall contrast in the synchrotron X‐ray topographs of (100) Fe‐3 wt% Si crystals compressed along an easy direction of magnetization'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver