Magnetic, electrical and surface morphological characterization of AuGe/Ni/Au Ohmic contact metallization on GaAs/AlGaAs multilayer structures
- T. S. Abhilash*
- , Ch Ravi Kumar
- , G. Rajaram
*Corresponding author for this work
- University of Hyderabad
Research output: Contribution to journal › Article › Scientific › peer-review
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