Making industrial measurements based on moire topography

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsProfessional

Original languageEnglish
Title of host publicationProceedings of ODIMAP II
Pages224-229
Publication statusPublished - 1999
MoE publication typeD3 Professional conference proceedings
Event2nd Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications - Pavia, Italy
Duration: 20 May 199922 May 1999

Conference

Conference2nd Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications
CountryItaly
CityPavia
Period20/05/9922/05/99

Cite this

Paakkari, J. (1999). Making industrial measurements based on moire topography. In Proceedings of ODIMAP II (pp. 224-229)
Paakkari, Jussi. / Making industrial measurements based on moire topography. Proceedings of ODIMAP II. 1999. pp. 224-229
@inproceedings{da3e757b64d344858584e1581a36c1a0,
title = "Making industrial measurements based on moire topography",
author = "Jussi Paakkari",
year = "1999",
language = "English",
pages = "224--229",
booktitle = "Proceedings of ODIMAP II",

}

Paakkari, J 1999, Making industrial measurements based on moire topography. in Proceedings of ODIMAP II. pp. 224-229, 2nd Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications, Pavia, Italy, 20/05/99.

Making industrial measurements based on moire topography. / Paakkari, Jussi.

Proceedings of ODIMAP II. 1999. p. 224-229.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsProfessional

TY - GEN

T1 - Making industrial measurements based on moire topography

AU - Paakkari, Jussi

PY - 1999

Y1 - 1999

M3 - Conference article in proceedings

SP - 224

EP - 229

BT - Proceedings of ODIMAP II

ER -

Paakkari J. Making industrial measurements based on moire topography. In Proceedings of ODIMAP II. 1999. p. 224-229