Making industrial measurements based on moire topography

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsProfessional

Original languageEnglish
Title of host publicationProceedings of ODIMAP II
Pages224-229
Publication statusPublished - 1999
MoE publication typeD3 Professional conference proceedings
Event2nd Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications - Pavia, Italy
Duration: 20 May 199922 May 1999

Conference

Conference2nd Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications
CountryItaly
CityPavia
Period20/05/9922/05/99

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