Making industrial measurements based on moire topography

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Professional

Original language	English
Title of host publication	Proceedings of ODIMAP II
Pages	224-229
Publication status	Published - 1999
MoE publication type	D3 Professional conference proceedings
Event	2nd Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications - Pavia, Italy Duration: 20 May 1999 → 22 May 1999

Conference	2nd Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications
Country/Territory	Italy
City	Pavia
Period	20/05/99 → 22/05/99

Cite this

@inproceedings{da3e757b64d344858584e1581a36c1a0,

title = "Making industrial measurements based on moire topography",

author = "Jussi Paakkari",

year = "1999",

language = "English",

pages = "224--229",

booktitle = "Proceedings of ODIMAP II",

note = "2nd Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications ; Conference date: 20-05-1999 Through 22-05-1999",

}