Keyphrases
Image Processing
100%
Grid Image
100%
Grid Projection
100%
Ultrasonic Thickness Measurement
100%
Three-dimensional (3D)
50%
Image Processing Method
50%
Mapping Method
50%
Curved Surface
50%
Image Pattern
50%
Imaging Algorithm
50%
Complementary Metal Oxide Semiconductor
50%
Pattern Generator
50%
Three-dimensional Surface
50%
Surface Mapping
50%
Ultrasonic Thickness Gauge
50%
Laser Pattern Generator
50%
Grid Node
50%
Thickness Map
50%
Semiconductor Compton Camera
50%
Thickness Gauge
50%
Flaw Detector
50%
Metal Loss Defect
50%
Mathematical Relationship
50%
INIS
surfaces
100%
thickness
100%
grids
100%
mapping
100%
lasers
100%
image processing
100%
ultrasonics
100%
metals
28%
thickness gages
28%
values
14%
images
14%
oxides
14%
losses
14%
pipes
14%
cameras
14%
dimensions
14%
algorithms
14%
inspection
14%
semiconductor materials
14%
defects
14%
flaws
14%
measured values
14%
Engineering
Image Processing
100%
Ultrasonics
100%
Pattern Generator
66%
Measured Value
33%
Grid Node
33%
Performed Measurement
33%
Inspection Surface
33%
Complementary Metal-Oxide-Semiconductor
33%
Dimensional Surface
33%
Image Processing Method
33%
Mapping Method
33%
Image Processing Algorithm
33%