Material characterization probe

Harri Jeskanen, Pentti Kauppinen, Jorma Pitkänen, Seppo Tähtinen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    Original languageEnglish
    Title of host publicationProceedings of the 15th World Conference on Non-Destructive Testing
    Publication statusPublished - 2000
    MoE publication typeNot Eligible
    Event15th World Conference on Non-Destructive Testing, WCNDT Roma 2000 - Rome, Italy
    Duration: 15 Oct 200021 Oct 2000

    Conference

    Conference15th World Conference on Non-Destructive Testing, WCNDT Roma 2000
    Abbreviated title15th WCNDT Roma 2000
    CountryItaly
    CityRome
    Period15/10/0021/10/00

    Cite this

    Jeskanen, H., Kauppinen, P., Pitkänen, J., & Tähtinen, S. (2000). Material characterization probe. In Proceedings of the 15th World Conference on Non-Destructive Testing