This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.
|Publication status||Published - 2012|
|MoE publication type||Not Eligible|
|Event||ESA Microwave technologies and techniques workshop - Noordwijk, Netherlands|
Duration: 10 May 2012 → 12 May 2012
|Workshop||ESA Microwave technologies and techniques workshop|
|Period||10/05/12 → 12/05/12|