Material measurement in the frequency range of 75-325 GHz using a vector network analyzer

Subash Khanal, Tero Kiuru, Juha Mallat, Olli Luukkonen, Antti V. Räisänen

Research output: Contribution to conferenceConference articleScientificpeer-review

Abstract

This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.
Original languageEnglish
Publication statusPublished - 2012
MoE publication typeNot Eligible
EventESA Microwave technologies and techniques workshop - Noordwijk, Netherlands
Duration: 10 May 201212 May 2012

Workshop

WorkshopESA Microwave technologies and techniques workshop
CountryNetherlands
CityNoordwijk
Period10/05/1212/05/12

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Electric network analyzers
Permittivity
Scattering parameters
Simulators

Cite this

Khanal, S., Kiuru, T., Mallat, J., Luukkonen, O., & Räisänen, A. V. (2012). Material measurement in the frequency range of 75-325 GHz using a vector network analyzer. Paper presented at ESA Microwave technologies and techniques workshop, Noordwijk, Netherlands.
Khanal, Subash ; Kiuru, Tero ; Mallat, Juha ; Luukkonen, Olli ; Räisänen, Antti V. / Material measurement in the frequency range of 75-325 GHz using a vector network analyzer. Paper presented at ESA Microwave technologies and techniques workshop, Noordwijk, Netherlands.
@conference{d11f1eee7b9c4f7588e383ddfc830617,
title = "Material measurement in the frequency range of 75-325 GHz using a vector network analyzer",
abstract = "This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.",
author = "Subash Khanal and Tero Kiuru and Juha Mallat and Olli Luukkonen and R{\"a}is{\"a}nen, {Antti V.}",
year = "2012",
language = "English",
note = "ESA Microwave technologies and techniques workshop ; Conference date: 10-05-2012 Through 12-05-2012",

}

Khanal, S, Kiuru, T, Mallat, J, Luukkonen, O & Räisänen, AV 2012, 'Material measurement in the frequency range of 75-325 GHz using a vector network analyzer' Paper presented at ESA Microwave technologies and techniques workshop, Noordwijk, Netherlands, 10/05/12 - 12/05/12, .

Material measurement in the frequency range of 75-325 GHz using a vector network analyzer. / Khanal, Subash; Kiuru, Tero; Mallat, Juha; Luukkonen, Olli; Räisänen, Antti V.

2012. Paper presented at ESA Microwave technologies and techniques workshop, Noordwijk, Netherlands.

Research output: Contribution to conferenceConference articleScientificpeer-review

TY - CONF

T1 - Material measurement in the frequency range of 75-325 GHz using a vector network analyzer

AU - Khanal, Subash

AU - Kiuru, Tero

AU - Mallat, Juha

AU - Luukkonen, Olli

AU - Räisänen, Antti V.

PY - 2012

Y1 - 2012

N2 - This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.

AB - This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.

M3 - Conference article

ER -

Khanal S, Kiuru T, Mallat J, Luukkonen O, Räisänen AV. Material measurement in the frequency range of 75-325 GHz using a vector network analyzer. 2012. Paper presented at ESA Microwave technologies and techniques workshop, Noordwijk, Netherlands.