Material measurement in the frequency range of 75-325 GHz using a vector network analyzer

Subash Khanal; Tero Kiuru; Juha Mallat; Olli Luukkonen; Antti V. Räisänen

Material measurement in the frequency range of 75-325 GHz using a vector network analyzer

Subash Khanal
, Tero Kiuru
, Juha Mallat
, Olli Luukkonen
, Antti V. Räisänen

VTT Technical Research Centre of Finland

Aalto University
Nokia Research Center

Research output: Contribution to conference › Conference article › Scientific › peer-review

Abstract

This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.

Original language	English
Publication status	Published - 2012
MoE publication type	Not Eligible
Event	ESA Microwave technologies and techniques workshop - Noordwijk, Netherlands Duration: 10 May 2012 → 12 May 2012

Workshop

Workshop	ESA Microwave technologies and techniques workshop
Country/Territory	Netherlands
City	Noordwijk
Period	10/05/12 → 12/05/12

Cite this

@conference{d11f1eee7b9c4f7588e383ddfc830617,

title = "Material measurement in the frequency range of 75-325 GHz using a vector network analyzer",

abstract = "This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.",

author = "Subash Khanal and Tero Kiuru and Juha Mallat and Olli Luukkonen and R{\"a}is{\"a}nen, \{Antti V.\}",

year = "2012",

language = "English",

note = "ESA Microwave technologies and techniques workshop ; Conference date: 10-05-2012 Through 12-05-2012",

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TY - CONF

T1 - Material measurement in the frequency range of 75-325 GHz using a vector network analyzer

AU - Khanal, Subash

AU - Kiuru, Tero

AU - Mallat, Juha

AU - Luukkonen, Olli

AU - Räisänen, Antti V.

PY - 2012

Y1 - 2012

N2 - This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.

AB - This paper presents a fast, accurate and easy to use measurement method to extract two parameters of the dielectric material (permittivity and loss tangent) in the frequency range of 75 to 325 GHz. The reflection and transmission S-parameters are measured using a network analyzer and then are compared with the simulated plots from the full wave simulator (HFSS) to obtain the permittivity and the loss tangent of the test material. The proposed topic for the paper is Device modeling and characterization and the proposed type of presentation is poster.

M3 - Conference article

T2 - ESA Microwave technologies and techniques workshop

Y2 - 10 May 2012 through 12 May 2012

ER -

Material measurement in the frequency range of 75-325 GHz using a vector network analyzer

Abstract

Workshop

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