Material standards design for minimum zone fitting of freeform optics

Yassir Arezki (Corresponding author), François Lepretre, Pavel Psota, Rong Su, Ville Heikkinen, Xiangchao Zhang, Na Cai, Youichi Bitou, Richard Leach, Vít Lédl, Nabil Anwer, Charyar Mehdi-Souzani, Hichem Nouira

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    1 Citation (Scopus)

    Abstract

    In most cases, ultra-high-precision coordinate measuring machines (CMMs) are used to measure manufactured parts especially in the presence of freeform surfaces. The obtained data should be then processed to determine a quality measure of the surface. The least value of peak-to-valley (PV) is the widely used quality measure since it conforms to the ISO Geometrical and Product Specification (GPS) standards. To determine the minimum value of PV, a number of fitting methods exist but minimum zone fitting is the most suitable since it directly minimizes the PV. In the measurement process, fitting algorithms are essential elements. For this reason, their quality must be assessed as well; this could be achieved using either softgauges or material artefacts. In this paper, a design of a reference thermo-invariant material standard for minimum zone fitting is suggested and manufactured. The artefact was then measured by a number of partners participating to the FreeFORM 15SIB-01 project so as a comparison could be made in the light of gathered measurements.

    Original languageEnglish
    Title of host publication19th International Conference of the European Society for Precision Engineering and Nanotechnology
    Subtitle of host publicationEUSPEN 2019
    EditorsRichard K. Leach, D. Billington, C. Nisbet, D. Phillips
    PublisherEuspen
    Pages264-267
    ISBN (Electronic)9780995775145
    Publication statusPublished - Jun 2019
    MoE publication typeA4 Article in a conference publication
    Event19th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2019 - Bilbao, Spain
    Duration: 3 Jun 20197 Jun 2019

    Conference

    Conference19th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2019
    Abbreviated titleEUSPEN 2019
    Country/TerritorySpain
    CityBilbao
    Period3/06/197/06/19

    Keywords

    • Artefacts
    • Freeform
    • Material standards
    • Minimum zone fitting

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