Measurement of a Timing Error Detection Latch Capable of Sub-threshold Operation

Matthew Turnquist, Erkka Laulalainen, Jani Mäkipää, Mika Pulkkinen, Lauri Koskinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

4 Citations (Scopus)

Abstract

To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.
Original languageEnglish
Title of host publication2009 NORCHIP
PublisherInstitute of Electrical and Electronic Engineers IEEE
ISBN (Electronic)978-1-4244-4311-6
ISBN (Print)978-1-4244-4310-9
DOIs
Publication statusPublished - 2010
MoE publication typeA4 Article in a conference publication
Event28th Norchip Conference, NORCHIP 2010 - Tampere, Finland
Duration: 15 Nov 201016 Nov 2010

Conference

Conference28th Norchip Conference, NORCHIP 2010
Abbreviated titleNORCHIP 2010
CountryFinland
CityTampere
Period15/11/1016/11/10

Fingerprint

Error detection
Networks (circuits)
Flip flop circuits
Drain current
Adaptive systems
Electric potential
Threshold voltage
Energy utilization
Testing

Cite this

Turnquist, M., Laulalainen, E., Mäkipää, J., Pulkkinen, M., & Koskinen, L. (2010). Measurement of a Timing Error Detection Latch Capable of Sub-threshold Operation. In 2009 NORCHIP Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/NORCHP.2009.5397791
Turnquist, Matthew ; Laulalainen, Erkka ; Mäkipää, Jani ; Pulkkinen, Mika ; Koskinen, Lauri. / Measurement of a Timing Error Detection Latch Capable of Sub-threshold Operation. 2009 NORCHIP. Institute of Electrical and Electronic Engineers IEEE, 2010.
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abstract = "To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.",
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Turnquist, M, Laulalainen, E, Mäkipää, J, Pulkkinen, M & Koskinen, L 2010, Measurement of a Timing Error Detection Latch Capable of Sub-threshold Operation. in 2009 NORCHIP. Institute of Electrical and Electronic Engineers IEEE, 28th Norchip Conference, NORCHIP 2010 , Tampere, Finland, 15/11/10. https://doi.org/10.1109/NORCHP.2009.5397791

Measurement of a Timing Error Detection Latch Capable of Sub-threshold Operation. / Turnquist, Matthew; Laulalainen, Erkka; Mäkipää, Jani; Pulkkinen, Mika; Koskinen, Lauri.

2009 NORCHIP. Institute of Electrical and Electronic Engineers IEEE, 2010.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

TY - GEN

T1 - Measurement of a Timing Error Detection Latch Capable of Sub-threshold Operation

AU - Turnquist, Matthew

AU - Laulalainen, Erkka

AU - Mäkipää, Jani

AU - Pulkkinen, Mika

AU - Koskinen, Lauri

N1 - Project code: 25726

PY - 2010

Y1 - 2010

N2 - To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.

AB - To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.

U2 - 10.1109/NORCHP.2009.5397791

DO - 10.1109/NORCHP.2009.5397791

M3 - Conference article in proceedings

SN - 978-1-4244-4310-9

BT - 2009 NORCHIP

PB - Institute of Electrical and Electronic Engineers IEEE

ER -

Turnquist M, Laulalainen E, Mäkipää J, Pulkkinen M, Koskinen L. Measurement of a Timing Error Detection Latch Capable of Sub-threshold Operation. In 2009 NORCHIP. Institute of Electrical and Electronic Engineers IEEE. 2010 https://doi.org/10.1109/NORCHP.2009.5397791