Measurement of a timing error detection latch capable of sub-threshold operation

Matthew J. Turnquist, Erkka Laulainen, Jani Mäkipää, Mika Pulkkinen, Lauri Koskinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.
Original languageEnglish
Title of host publicationNORCHIP 2009
PublisherIEEE Institute of Electrical and Electronic Engineers
Number of pages4
ISBN (Electronic)978-1-4244-4311-6
ISBN (Print)978-1-4244-4310-9
DOIs
Publication statusPublished - 2009
MoE publication typeA4 Article in a conference publication
Event2009 NORCHIP Conference - Trondheim, Norway
Duration: 16 Nov 200917 Nov 2009

Conference

Conference2009 NORCHIP Conference
CountryNorway
CityTrondheim
Period16/11/0917/11/09

Fingerprint

Error detection
Networks (circuits)
Flip flop circuits
Drain current
Adaptive systems
Electric potential
Threshold voltage
Energy utilization
Testing

Cite this

Turnquist, M. J., Laulainen, E., Mäkipää, J., Pulkkinen, M., & Koskinen, L. (2009). Measurement of a timing error detection latch capable of sub-threshold operation. In NORCHIP 2009 IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/NORCHP.2009.5397791
Turnquist, Matthew J. ; Laulainen, Erkka ; Mäkipää, Jani ; Pulkkinen, Mika ; Koskinen, Lauri. / Measurement of a timing error detection latch capable of sub-threshold operation. NORCHIP 2009. IEEE Institute of Electrical and Electronic Engineers , 2009.
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Turnquist, MJ, Laulainen, E, Mäkipää, J, Pulkkinen, M & Koskinen, L 2009, Measurement of a timing error detection latch capable of sub-threshold operation. in NORCHIP 2009. IEEE Institute of Electrical and Electronic Engineers , 2009 NORCHIP Conference, Trondheim, Norway, 16/11/09. https://doi.org/10.1109/NORCHP.2009.5397791

Measurement of a timing error detection latch capable of sub-threshold operation. / Turnquist, Matthew J.; Laulainen, Erkka; Mäkipää, Jani; Pulkkinen, Mika; Koskinen, Lauri.

NORCHIP 2009. IEEE Institute of Electrical and Electronic Engineers , 2009.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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T1 - Measurement of a timing error detection latch capable of sub-threshold operation

AU - Turnquist, Matthew J.

AU - Laulainen, Erkka

AU - Mäkipää, Jani

AU - Pulkkinen, Mika

AU - Koskinen, Lauri

PY - 2009

Y1 - 2009

N2 - To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.

AB - To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.

U2 - 10.1109/NORCHP.2009.5397791

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BT - NORCHIP 2009

PB - IEEE Institute of Electrical and Electronic Engineers

ER -

Turnquist MJ, Laulainen E, Mäkipää J, Pulkkinen M, Koskinen L. Measurement of a timing error detection latch capable of sub-threshold operation. In NORCHIP 2009. IEEE Institute of Electrical and Electronic Engineers . 2009 https://doi.org/10.1109/NORCHP.2009.5397791