Measurement of a timing error detection latch capable of sub-threshold operation

Matthew J. Turnquist; Erkka Laulainen; Jani Mäkipää; Mika Pulkkinen; Lauri Koskinen

doi:10.1109/NORCHP.2009.5397791

Measurement of a timing error detection latch capable of sub-threshold operation

Matthew J. Turnquist, Erkka Laulainen, Jani Mäkipää, Mika Pulkkinen, Lauri Koskinen

VTT Technical Research Centre of Finland

Helsinki University of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.

Original language	English
Title of host publication	NORCHIP 2009
Publisher	IEEE Institute of Electrical and Electronic Engineers
Number of pages	4
ISBN (Electronic)	978-1-4244-4311-6
ISBN (Print)	978-1-4244-4310-9
DOIs	https://doi.org/10.1109/NORCHP.2009.5397791
Publication status	Published - 2009
MoE publication type	A4 Article in a conference publication
Event	2009 NORCHIP Conference - Trondheim, Norway Duration: 16 Nov 2009 → 17 Nov 2009

Conference

Conference	2009 NORCHIP Conference
Country/Territory	Norway
City	Trondheim
Period	16/11/09 → 17/11/09

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10.1109/NORCHP.2009.5397791

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title = "Measurement of a timing error detection latch capable of sub-threshold operation",

abstract = "To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.",

author = "Turnquist, {Matthew J.} and Erkka Laulainen and Jani M{\"a}kip{\"a}{\"a} and Mika Pulkkinen and Lauri Koskinen",

year = "2009",

doi = "10.1109/NORCHP.2009.5397791",

language = "English",

isbn = "978-1-4244-4310-9",

booktitle = "NORCHIP 2009",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "2009 NORCHIP Conference ; Conference date: 16-11-2009 Through 17-11-2009",

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TY - GEN

T1 - Measurement of a timing error detection latch capable of sub-threshold operation

AU - Turnquist, Matthew J.

AU - Laulainen, Erkka

AU - Mäkipää, Jani

AU - Pulkkinen, Mika

AU - Koskinen, Lauri

PY - 2009

Y1 - 2009

N2 - To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.

AB - To take advantage of minimum energy consumption in sub-threshold, systems are required to have robustness to variability. In sub-threshold, exponential drain current dependence on the threshold voltage produces large sensitivities to variations. Adaptive systems are required to respond to these conditions. One adaptive method, called timing error detection (TED), eliminates traditional safety margins by scaling the supply voltage or frequency until timing errors. Presented here is a TED latch test circuit that makes use of sub-threshold operation. The circuit was fabricated with a 65 nm CMOS process, operates from 0.2 V to 1.2 V, and has a minimum energy point (MEP) near 0.2 V. Using a testing matrix of voltage and frequency pairs, the error rate and energy per operation were also measured.

U2 - 10.1109/NORCHP.2009.5397791

DO - 10.1109/NORCHP.2009.5397791

M3 - Conference article in proceedings

SN - 978-1-4244-4310-9

BT - NORCHIP 2009

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 2009 NORCHIP Conference

Y2 - 16 November 2009 through 17 November 2009

ER -

Measurement of a timing error detection latch capable of sub-threshold operation

Abstract

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