Abstract
Original language | English |
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Pages (from-to) | 1442-1444 |
Number of pages | 3 |
Journal | Electronics Letters |
Volume | 32 |
Issue number | 16 |
DOIs | |
Publication status | Published - 1996 |
MoE publication type | A1 Journal article-refereed |
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Measurement of dielectric parameters of wall materials at 60 GHz band. / Lähteenmäki, Jaakko; Karttaavi, Timo.
In: Electronics Letters, Vol. 32, No. 16, 1996, p. 1442-1444.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Measurement of dielectric parameters of wall materials at 60 GHz band
AU - Lähteenmäki, Jaakko
AU - Karttaavi, Timo
N1 - Project code: T6SU00078
PY - 1996
Y1 - 1996
N2 - A method for determining of the dielectric parameters of light internal wall materials at millimetre-wave frequencies is presented. The method is based on transmission coefficient measurement of a wall sample consisting of two slabs, the distance of which is variable. The dielectric parameters of the slabs can be determined by finding the parameter values which yield the minimum difference between measured and calculated transmission coefficient values. The results for plasterboard and chipboard walls are in line with the results given previously in the literature.
AB - A method for determining of the dielectric parameters of light internal wall materials at millimetre-wave frequencies is presented. The method is based on transmission coefficient measurement of a wall sample consisting of two slabs, the distance of which is variable. The dielectric parameters of the slabs can be determined by finding the parameter values which yield the minimum difference between measured and calculated transmission coefficient values. The results for plasterboard and chipboard walls are in line with the results given previously in the literature.
U2 - 10.1049/el:19960954
DO - 10.1049/el:19960954
M3 - Article
VL - 32
SP - 1442
EP - 1444
JO - Electronics Letters
JF - Electronics Letters
SN - 0013-5194
IS - 16
ER -