Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator

Subash Khanal; Tero Kiuru; Juha Mallat; Olli Luukkonen; Antti V. Räisänen

Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator

Subash Khanal, Tero Kiuru, Juha Mallat, Olli Luukkonen, Antti V. Räisänen

Research output: Contribution to journal › Article › Scientific › peer-review

Abstract

This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.

Original language	English
Pages (from-to)	551-556
Number of pages	5
Journal	Radioengineering
Volume	21
Issue number	2
Publication status	Published - 2012
MoE publication type	A1 Journal article-refereed

Keywords

Dielectric constant
permittivity
loss tangent
S-parameters
material measurement

Access to Document

http://www.radioeng.cz/fulltexts/2012/12_02_0551_0556.pdf

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Cite this

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title = "Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator",

abstract = "This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.",

keywords = "Dielectric constant, permittivity, loss tangent, S-parameters, material measurement",

author = "Subash Khanal and Tero Kiuru and Juha Mallat and Olli Luukkonen and R{\"a}is{\"a}nen, {Antti V.}",

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journal = "Radioengineering",

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AU - Mallat, Juha

AU - Luukkonen, Olli

AU - Räisänen, Antti V.

PY - 2012

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N2 - This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.

AB - This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.

KW - Dielectric constant

KW - permittivity

KW - loss tangent

KW - S-parameters

KW - material measurement

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EP - 556

JO - Radioengineering

JF - Radioengineering

SN - 1210-2512

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