Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator

Subash Khanal, Tero Kiuru, Juha Mallat, Olli Luukkonen, Antti V. Räisänen

Research output: Contribution to journal › Article › Scientific › peer-review

7 Citations (Scopus)

Abstract

This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.
Original languageEnglish
Pages (from-to)551-556
Number of pages5
JournalRadioengineering
Volume21
Issue number2
Publication statusPublished - 2012
MoE publication typeA1 Journal article-refereed

Fingerprint

Electric network analyzers
Dielectric properties
Waveguides
Permittivity
Simulators
Scattering parameters

Keywords

  • Dielectric constant
  • permittivity
  • loss tangent
  • S-parameters
  • material measurement

Cite this

Khanal, Subash ; Kiuru, Tero ; Mallat, Juha ; Luukkonen, Olli ; Räisänen, Antti V. / Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator. In: Radioengineering. 2012 ; Vol. 21, No. 2. pp. 551-556.
@article{9c488f6b883346e7acf4b6857f4fd711,
title = "Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator",
abstract = "This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.",
keywords = "Dielectric constant, permittivity, loss tangent, S-parameters, material measurement",
author = "Subash Khanal and Tero Kiuru and Juha Mallat and Olli Luukkonen and R{\"a}is{\"a}nen, {Antti V.}",
year = "2012",
language = "English",
volume = "21",
pages = "551--556",
journal = "Radioengineering",
issn = "1210-2512",
publisher = "Czech Technical University",
number = "2",

}

Khanal, S, Kiuru, T, Mallat, J, Luukkonen, O & Räisänen, AV 2012, 'Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator', Radioengineering, vol. 21, no. 2, pp. 551-556.

Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator. / Khanal, Subash; Kiuru, Tero; Mallat, Juha; Luukkonen, Olli; Räisänen, Antti V.

In: Radioengineering, Vol. 21, No. 2, 2012, p. 551-556.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator

AU - Khanal, Subash

AU - Kiuru, Tero

AU - Mallat, Juha

AU - Luukkonen, Olli

AU - Räisänen, Antti V.

PY - 2012

Y1 - 2012

N2 - This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.

AB - This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.

KW - Dielectric constant

KW - permittivity

KW - loss tangent

KW - S-parameters

KW - material measurement

M3 - Article

VL - 21

SP - 551

EP - 556

JO - Radioengineering

JF - Radioengineering

SN - 1210-2512

IS - 2

ER -

Khanal S, Kiuru T, Mallat J, Luukkonen O, Räisänen AV. Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator. Radioengineering. 2012;21(2):551-556.

Access to Document