Abstract
This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.
| Original language | English |
|---|---|
| Pages (from-to) | 551-556 |
| Number of pages | 5 |
| Journal | Radioengineering |
| Volume | 21 |
| Issue number | 2 |
| Publication status | Published - 2012 |
| MoE publication type | A1 Journal article-refereed |
Fingerprint
Keywords
- Dielectric constant
- permittivity
- loss tangent
- S-parameters
- material measurement
Cite this
Khanal, S., Kiuru, T., Mallat, J., Luukkonen, O., & Räisänen, A. V. (2012). Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator. Radioengineering, 21(2), 551-556.