Measurement of Dielectric Properties at 75-325 GHz using a Vector Network Analyzer and Full Wave Simulator

Subash Khanal, Tero Kiuru, Juha Mallat, Olli Luukkonen, Antti V. Räisänen

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    Abstract

    This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.
    Original languageEnglish
    Pages (from-to)551-556
    Number of pages5
    JournalRadioengineering
    Volume21
    Issue number2
    Publication statusPublished - 2012
    MoE publication typeA1 Journal article-refereed

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    Keywords

    • Dielectric constant
    • permittivity
    • loss tangent
    • S-parameters
    • material measurement

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