Measurement of ink and water compatibility in litho offset lithography

Anneli Karttunen, Jouko Virtanen, Ulf Lindqvist

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsProfessional

    Original languageEnglish
    Title of host publicationProceedings of the 18th International Conference of Printing Research Institutes
    EditorsWilliam H. Banks
    Place of PublicationLondon
    PublisherPentech Press
    Pages241-263
    ISBN (Print) 0-7273-0110-1
    Publication statusPublished - 1986
    MoE publication typeD3 Professional conference proceedings
    Event18th International Conference of Printing Research Institutes - Williamsburg, United States
    Duration: 1 Jun 198530 Jun 1985

    Publication series

    SeriesAdvances in Printing Science and Technology
    Volume18

    Conference

    Conference18th International Conference of Printing Research Institutes
    CountryUnited States
    CityWilliamsburg
    Period1/06/8530/06/85

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