### Abstract

UHV system components rated above 800kV class has led to difficulties in achieving the standard waveshapes as required by IEC60060 Parts 1 and 2 and other existing IEC, IEEE/ANSI and other standards. One of the limiting components in achieving the maximum capacitive loading on an impulse generator for standard lightning impulse front times is the inductance of the circuit. The total inductance of the circuit is comprised of the internal inductance of the impulse generator and the inductance of the loop to connect to the load. The higher the voltage class of test objects, the larger the loop, yielding more inductance that in turn, reduces the test capacitance that can be connected and still remain inside the overshoot requirements of the standards. The internal

inductance of the impulse generator is comprised of the wiring of the stages and the stage capacitor inductance and/or the inductance of the waveshaping resistors. This paper shows the results of methods to measure and calculate the internal inductance of several impulse generators and we review the formulas for calculating the maximum load of an impulse generator with a given internal inductance. We believe these methods give more realistic values than adding up nameplate inductance values from an impulse generator. The paper also reviews the pros and cons of higher stage capacitances in impulse generators to test larger loads that are ultimately limited by the circuit inductance value. The intent of this paper is to assist in the revision of future IEC and IEEE standards for impulse testing apparatus in the UHV range.

Original language | English |
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Title of host publication | Proceedings |

Number of pages | 5 |

Publication status | Published - 2017 |

MoE publication type | A4 Article in a conference publication |

Event | 20th International Symposium on High Voltage Engineering, ISH 2017 - Buenos Aires, Argentina Duration: 28 Aug 2017 → 1 Sep 2017 |

### Conference

Conference | 20th International Symposium on High Voltage Engineering, ISH 2017 |
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Abbreviated title | ISH 2017 |

Country | Argentina |

City | Buenos Aires |

Period | 28/08/17 → 1/09/17 |

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### Cite this

*Proceedings*

}

*Proceedings.*20th International Symposium on High Voltage Engineering, ISH 2017, Buenos Aires, Argentina, 28/08/17.

**Measurement of the Internal Inductance of Impulse Voltage Generators and the Limits of LI Front Times.** / Larzelere, William (Corresponding author); Hällström, Jari; Elg, Alf-Peter; Bergman, Anders; Klüss, Joni; Li, Yi; Zhou, Lljun.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Measurement of the Internal Inductance of Impulse Voltage Generators and the Limits of LI Front Times

AU - Larzelere, William

AU - Hällström, Jari

AU - Elg, Alf-Peter

AU - Bergman, Anders

AU - Klüss, Joni

AU - Li, Yi

AU - Zhou, Lljun

PY - 2017

Y1 - 2017

N2 - The recent push to higher testing voltages for research and production tests onUHV system components rated above 800kV class has led to difficulties in achieving the standard waveshapes as required by IEC60060 Parts 1 and 2 and other existing IEC, IEEE/ANSI and other standards. One of the limiting components in achieving the maximum capacitive loading on an impulse generator for standard lightning impulse front times is the inductance of the circuit. The total inductance of the circuit is comprised of the internal inductance of the impulse generator and the inductance of the loop to connect to the load. The higher the voltage class of test objects, the larger the loop, yielding more inductance that in turn, reduces the test capacitance that can be connected and still remain inside the overshoot requirements of the standards. The internalinductance of the impulse generator is comprised of the wiring of the stages and the stage capacitor inductance and/or the inductance of the waveshaping resistors. This paper shows the results of methods to measure and calculate the internal inductance of several impulse generators and we review the formulas for calculating the maximum load of an impulse generator with a given internal inductance. We believe these methods give more realistic values than adding up nameplate inductance values from an impulse generator. The paper also reviews the pros and cons of higher stage capacitances in impulse generators to test larger loads that are ultimately limited by the circuit inductance value. The intent of this paper is to assist in the revision of future IEC and IEEE standards for impulse testing apparatus in the UHV range.

AB - The recent push to higher testing voltages for research and production tests onUHV system components rated above 800kV class has led to difficulties in achieving the standard waveshapes as required by IEC60060 Parts 1 and 2 and other existing IEC, IEEE/ANSI and other standards. One of the limiting components in achieving the maximum capacitive loading on an impulse generator for standard lightning impulse front times is the inductance of the circuit. The total inductance of the circuit is comprised of the internal inductance of the impulse generator and the inductance of the loop to connect to the load. The higher the voltage class of test objects, the larger the loop, yielding more inductance that in turn, reduces the test capacitance that can be connected and still remain inside the overshoot requirements of the standards. The internalinductance of the impulse generator is comprised of the wiring of the stages and the stage capacitor inductance and/or the inductance of the waveshaping resistors. This paper shows the results of methods to measure and calculate the internal inductance of several impulse generators and we review the formulas for calculating the maximum load of an impulse generator with a given internal inductance. We believe these methods give more realistic values than adding up nameplate inductance values from an impulse generator. The paper also reviews the pros and cons of higher stage capacitances in impulse generators to test larger loads that are ultimately limited by the circuit inductance value. The intent of this paper is to assist in the revision of future IEC and IEEE standards for impulse testing apparatus in the UHV range.

M3 - Conference article in proceedings

SN - 978-987-45745-6-5

BT - Proceedings

ER -