Measurement uncertainty in the presence of low frequency noise

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    12 Citations (Scopus)

    Abstract

    We discuss the measurement uncertainty in the presence of different types of fundamental noise processes, especially 1/f noise. The treatment is based on the Allan variance of an n-sample average with two deadtime parameters relevant in metrology. Some results applicable to situations that are common in metrology, e.g., international comparisons, are derived. Experimentally, the output of Zener voltage standards in the frequency range from 10/sup -6/ Hz to 10/sup 3/ Hz is studied and behavior closely resembling that of 1/f noise is found at all time scales of practical interest. The noise floor of a 10 V Zener standard was found to be 60 nV and the 1/f corner frequency 3.5 Hz. Environmental variations cause the long-term (>100 s) deviations of the Zener voltage to slightly increase from the limiting 1/f noise level.
    Original languageEnglish
    Pages (from-to)453-456
    Number of pages4
    JournalIEEE Transactions on Instrumentation and Measurement
    Volume50
    Issue number2
    DOIs
    Publication statusPublished - 2001
    MoE publication typeA1 Journal article-refereed

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    low frequencies
    metrology
    Electric potential
    electric potential
    frequency ranges
    Uncertainty
    deviation
    causes
    output

    Cite this

    @article{86fc9e8a0f514dba9014bca9dca09abf,
    title = "Measurement uncertainty in the presence of low frequency noise",
    abstract = "We discuss the measurement uncertainty in the presence of different types of fundamental noise processes, especially 1/f noise. The treatment is based on the Allan variance of an n-sample average with two deadtime parameters relevant in metrology. Some results applicable to situations that are common in metrology, e.g., international comparisons, are derived. Experimentally, the output of Zener voltage standards in the frequency range from 10/sup -6/ Hz to 10/sup 3/ Hz is studied and behavior closely resembling that of 1/f noise is found at all time scales of practical interest. The noise floor of a 10 V Zener standard was found to be 60 nV and the 1/f corner frequency 3.5 Hz. Environmental variations cause the long-term (>100 s) deviations of the Zener voltage to slightly increase from the limiting 1/f noise level.",
    author = "Panu Helist{\"o} and Heikki Sepp{\"a}",
    year = "2001",
    doi = "10.1109/19.918164",
    language = "English",
    volume = "50",
    pages = "453--456",
    journal = "IEEE Transactions on Instrumentation and Measurement",
    issn = "0018-9456",
    publisher = "IEEE Institute of Electrical and Electronic Engineers",
    number = "2",

    }

    Measurement uncertainty in the presence of low frequency noise. / Helistö, Panu; Seppä, Heikki.

    In: IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 2, 2001, p. 453-456.

    Research output: Contribution to journalArticleScientificpeer-review

    TY - JOUR

    T1 - Measurement uncertainty in the presence of low frequency noise

    AU - Helistö, Panu

    AU - Seppä, Heikki

    PY - 2001

    Y1 - 2001

    N2 - We discuss the measurement uncertainty in the presence of different types of fundamental noise processes, especially 1/f noise. The treatment is based on the Allan variance of an n-sample average with two deadtime parameters relevant in metrology. Some results applicable to situations that are common in metrology, e.g., international comparisons, are derived. Experimentally, the output of Zener voltage standards in the frequency range from 10/sup -6/ Hz to 10/sup 3/ Hz is studied and behavior closely resembling that of 1/f noise is found at all time scales of practical interest. The noise floor of a 10 V Zener standard was found to be 60 nV and the 1/f corner frequency 3.5 Hz. Environmental variations cause the long-term (>100 s) deviations of the Zener voltage to slightly increase from the limiting 1/f noise level.

    AB - We discuss the measurement uncertainty in the presence of different types of fundamental noise processes, especially 1/f noise. The treatment is based on the Allan variance of an n-sample average with two deadtime parameters relevant in metrology. Some results applicable to situations that are common in metrology, e.g., international comparisons, are derived. Experimentally, the output of Zener voltage standards in the frequency range from 10/sup -6/ Hz to 10/sup 3/ Hz is studied and behavior closely resembling that of 1/f noise is found at all time scales of practical interest. The noise floor of a 10 V Zener standard was found to be 60 nV and the 1/f corner frequency 3.5 Hz. Environmental variations cause the long-term (>100 s) deviations of the Zener voltage to slightly increase from the limiting 1/f noise level.

    U2 - 10.1109/19.918164

    DO - 10.1109/19.918164

    M3 - Article

    VL - 50

    SP - 453

    EP - 456

    JO - IEEE Transactions on Instrumentation and Measurement

    JF - IEEE Transactions on Instrumentation and Measurement

    SN - 0018-9456

    IS - 2

    ER -