Measurement uncertainty in the presence of low frequency noise

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12 Citations (Scopus)

Abstract

We discuss the measurement uncertainty in the presence of different types of fundamental noise processes, especially 1/f noise. The treatment is based on the Allan variance of an n-sample average with two deadtime parameters relevant in metrology. Some results applicable to situations that are common in metrology, e.g., international comparisons, are derived. Experimentally, the output of Zener voltage standards in the frequency range from 10/sup -6/ Hz to 10/sup 3/ Hz is studied and behavior closely resembling that of 1/f noise is found at all time scales of practical interest. The noise floor of a 10 V Zener standard was found to be 60 nV and the 1/f corner frequency 3.5 Hz. Environmental variations cause the long-term (>100 s) deviations of the Zener voltage to slightly increase from the limiting 1/f noise level.
Original languageEnglish
Pages (from-to)453-456
Number of pages4
JournalIEEE Transactions on Instrumentation and Measurement
Volume50
Issue number2
DOIs
Publication statusPublished - 2001
MoE publication typeA1 Journal article-refereed

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low frequencies
metrology
Electric potential
electric potential
frequency ranges
Uncertainty
deviation
causes
output

Cite this

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title = "Measurement uncertainty in the presence of low frequency noise",
abstract = "We discuss the measurement uncertainty in the presence of different types of fundamental noise processes, especially 1/f noise. The treatment is based on the Allan variance of an n-sample average with two deadtime parameters relevant in metrology. Some results applicable to situations that are common in metrology, e.g., international comparisons, are derived. Experimentally, the output of Zener voltage standards in the frequency range from 10/sup -6/ Hz to 10/sup 3/ Hz is studied and behavior closely resembling that of 1/f noise is found at all time scales of practical interest. The noise floor of a 10 V Zener standard was found to be 60 nV and the 1/f corner frequency 3.5 Hz. Environmental variations cause the long-term (>100 s) deviations of the Zener voltage to slightly increase from the limiting 1/f noise level.",
author = "Panu Helist{\"o} and Heikki Sepp{\"a}",
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Measurement uncertainty in the presence of low frequency noise. / Helistö, Panu; Seppä, Heikki.

In: IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 2, 2001, p. 453-456.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Measurement uncertainty in the presence of low frequency noise

AU - Helistö, Panu

AU - Seppä, Heikki

PY - 2001

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AB - We discuss the measurement uncertainty in the presence of different types of fundamental noise processes, especially 1/f noise. The treatment is based on the Allan variance of an n-sample average with two deadtime parameters relevant in metrology. Some results applicable to situations that are common in metrology, e.g., international comparisons, are derived. Experimentally, the output of Zener voltage standards in the frequency range from 10/sup -6/ Hz to 10/sup 3/ Hz is studied and behavior closely resembling that of 1/f noise is found at all time scales of practical interest. The noise floor of a 10 V Zener standard was found to be 60 nV and the 1/f corner frequency 3.5 Hz. Environmental variations cause the long-term (>100 s) deviations of the Zener voltage to slightly increase from the limiting 1/f noise level.

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