Abstract
This paper describes the motivation behind and the characteristics of a laser profiler which has been specifically tailored to the measurement of surface roughness characteristics of importance in the radar electromagnetic scattering studies-and hence inversion and retrieval algorithms. The main feature of this profiler is its capability of recording roughness profiles at the scale of the spaceborne SAR resolution, which is roughly of the order of 25 meters for current radar satellites such as ERS-2 or RADARSAT.
Original language | English |
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Title of host publication | IGARSS '98 |
Subtitle of host publication | Sensing and Managing the Environment |
Place of Publication | Seattle |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 1200-1202 |
ISBN (Print) | 0-7803-4403-0 |
DOIs | |
Publication status | Published - 1998 |
MoE publication type | A4 Article in a conference publication |
Event | 1998 IEEE International Geoscience and Remote Sensing Symposium - Sheraton, Seattle, United States Duration: 6 Jul 1998 → 10 Jul 1998 |
Conference
Conference | 1998 IEEE International Geoscience and Remote Sensing Symposium |
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Country/Territory | United States |
City | Seattle |
Period | 6/07/98 → 10/07/98 |