Measuring the roughness characteristics of natural surfaces at pixel scales: moving from 1 metre to 25 metre profiles

Malcolm Davidson*, Thuy Le Toan, Maurice Borgeaud, Terhikki Manninen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

16 Citations (Scopus)

Abstract

This paper describes the motivation behind and the characteristics of a laser profiler which has been specifically tailored to the measurement of surface roughness characteristics of importance in the radar electromagnetic scattering studies-and hence inversion and retrieval algorithms. The main feature of this profiler is its capability of recording roughness profiles at the scale of the spaceborne SAR resolution, which is roughly of the order of 25 meters for current radar satellites such as ERS-2 or RADARSAT.
Original languageEnglish
Title of host publicationIGARSS '98
Subtitle of host publicationSensing and Managing the Environment
Place of PublicationSeattle
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages1200-1202
ISBN (Print)0-7803-4403-0
DOIs
Publication statusPublished - 1998
MoE publication typeA4 Article in a conference publication
Event1998 IEEE International Geoscience and Remote Sensing Symposium - Sheraton, Seattle, United States
Duration: 6 Jul 199810 Jul 1998

Conference

Conference1998 IEEE International Geoscience and Remote Sensing Symposium
Country/TerritoryUnited States
CitySeattle
Period6/07/9810/07/98

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