MEMS FPI-based smartphone hyperspectral imager

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    16 Citations (Scopus)

    Abstract

    This paper demonstrates a mobile phone-compatible hyperspectral imager based on a tunable MEMS Fabry-Perot interferometer. The realized iPhone 5s hyperspectral imager (HSI) demonstrator utilizes MEMS FPI tunable filter for visible-range, which consist of atomic layer deposited (ALD) Al2O3/TiO2-thin film Bragg reflectors. Characterization results for the mobile phone hyperspectral imager utilizing MEMS FPI chip optimized for 500 nm is presented; the operation range is λ = 450-550 nm with FWHM between 8-15 nm. Also a configuration of two cascaded FPIs (λ = 500 nm and λ = 650 nm) combined with an RGB colour camera is presented. With this tandem configuration, the overall wavelength tuning range of MEMS hyperspectral imagers can be extended to cover a larger range than with a single FPI chip. The potential applications of mobile hyperspectral imagers in the vis-NIR range include authentication, counterfeit detection and potential health/wellness and food sensing applications.

    Original languageEnglish
    Title of host publicationNext-Generation Spectroscopic Technologies IX
    PublisherInternational Society for Optics and Photonics SPIE
    Volume9855
    ISBN (Electronic)9781510600966
    DOIs
    Publication statusPublished - 1 Jan 2016
    MoE publication typeA4 Article in a conference publication
    EventNext-Generation Spectroscopic Technologies IX - Baltimore, United States
    Duration: 18 Apr 201619 Apr 2016

    Conference

    ConferenceNext-Generation Spectroscopic Technologies IX
    CountryUnited States
    CityBaltimore
    Period18/04/1619/04/16

    Keywords

    • ALD
    • MEMS Fabry-Perot interferometer
    • microspectrometers
    • Mobile hyperspectral imaging
    • MOEMS
    • Smartphone spectroscopy

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  • Cite this

    Rissanen, A., Saari, H., Rainio, K., Stuns, I., Viherkanto, K., Holmlund, C., Näkki, I., & Ojanen, H. (2016). MEMS FPI-based smartphone hyperspectral imager. In Next-Generation Spectroscopic Technologies IX (Vol. 9855). [985507] International Society for Optics and Photonics SPIE. https://doi.org/10.1117/12.2229575