@inproceedings{0b1c4d7631dd4298af6dbe914a63dc20,
title = "Metal sheet thickness profile measurement method based on two-side line triangulation and continuous vibration compensation",
abstract = "Dimension measurements in metal production are getting increasingly important to improve quality and yield. One important measurement is thickness profile, in this case of copper strip. Knowing the strip profile in entrance and exit side of milling line helps optimizing the milling depth and give information about tool wearing. In this study a comparative measurement method was traversing point measurement system. It gives profile as a series of points which take a relatively long time to measure. Now presented method is based on two-side optical triangulation formed by line illuminators and CMOS-cameras and enables instantaneous thickness profile measurement. Results from both sides are fixed together using reference plates on both ends of the measurement area. From 1.3 m stand-off distance, 1.4 m wide measurement area is achieved. This paper presents the measurement method and results of laboratory and on-line tests. Using laser line illumination the accuracy of thickness was 150 µm when measuring 9 mm thick test plate. Accuracy was limited by laser speckle during static calibration. Other illumination method based on white light was therefore tested and the accuracy was 12 µm correspondingly. Measurement time for one profile was 1 second and resolution in cross machine direction 50 mm after averaging. Now presented method enables thickness profile measurement of copper and other metal sheets. Using white light the accuracy is at same level as the present traversing point measurement. Method has also continuous reference measurement to compensate errors caused by vibration; therefore the system can be realized at reasonable cost. (9 refs.)",
keywords = "thickness measurement, optical triangulation, laser speckle, thickness profile, metal sheet measurement",
author = "Petri Lehtonen and Jari Miettinen and Heimo Ker{\"a}nen and Tapio Vaarala",
note = "Project code: E4SU00373; Photonics Europe 2008 ; Conference date: 07-04-2008 Through 10-04-2008",
year = "2008",
doi = "10.1117/12.780800",
language = "English",
isbn = "978-0-8194-7201-4",
series = "Proceedings of SPIE",
publisher = "International Society for Optics and Photonics SPIE",
editor = "Francis Berghmans",
booktitle = "Proceedings of the SPIE",
address = "United States",
}