METefnet: developments in metrology for moisture in materials

Stephanie Bell, Rudolf Aro, Fausto Arpino, Seda Aytekin, Gino Cortellessa, Marco Dell'Isola, Zuzana Ferenčíková, Vito Fernicola, Roberto Gavioso, Eric Georgin, Martti Heinonen, Domen Hudoklin, Luari Jalukse, Nuray Karaböce, Ivo Leito, Anssi Mäkynen, Peng Miao, Jan Nielsen, Ileana Nicolescu, Martina RudolfováMaija Ojanen-Saloranta, Petri Österberg, Peter Østergaard, Mihaela Rujan, Michela Sega, Radek Strnad, Tereza Vachova

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publication17 International Congress of Metrology
    PublisherEDP Sciences
    Number of pages8
    DOIs
    Publication statusPublished - 2015
    MoE publication typeB3 Non-refereed article in conference proceedings
    Event17th International Congress of Metrology, CIM 2015 - Paris, France
    Duration: 21 Sep 201524 Sep 2015

    Conference

    Conference17th International Congress of Metrology, CIM 2015
    Abbreviated titleCIM 2015
    Country/TerritoryFrance
    CityParis
    Period21/09/1524/09/15

    Keywords

    • moisture
    • solid materials
    • SI traceability

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