METefnet: developments in metrology for moisture in materials

Stephanie Bell, Rudolf Aro, Fausto Arpino, Seda Aytekin, Gino Cortellessa, Marco Dell'Isola, Zuzana Ferenčíková, Vito Fernicola, Roberto Gavioso, Eric Georgin, Martti Heinonen, Domen Hudoklin, Luari Jalukse, Nuray Karaböce, Ivo Leito, Anssi Mäkynen, Peng Miao, Jan Nielsen, Ileana Nicolescu, Martina RudolfováMaija Ojanen-Saloranta, Petri Österberg, Peter Østergaard, Mihaela Rujan, Michela Sega, Radek Strnad, Tereza Vachova

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

3 Citations (Scopus)
Original languageEnglish
Title of host publication17 International Congress of Metrology
PublisherEDP Sciences
Number of pages8
DOIs
Publication statusPublished - 2015
MoE publication typeB3 Non-refereed article in conference proceedings
Event17th International Congress of Metrology, CIM 2015 - Paris, France
Duration: 21 Sep 201524 Sep 2015

Conference

Conference17th International Congress of Metrology, CIM 2015
Abbreviated titleCIM 2015
CountryFrance
CityParis
Period21/09/1524/09/15

Keywords

  • moisture
  • solid materials
  • SI traceability

Cite this

Bell, S., Aro, R., Arpino, F., Aytekin, S., Cortellessa, G., Dell'Isola, M., Ferenčíková, Z., Fernicola, V., Gavioso, R., Georgin, E., Heinonen, M., Hudoklin, D., Jalukse, L., Karaböce, N., Leito, I., Mäkynen, A., Miao, P., Nielsen, J., Nicolescu, I., ... Vachova, T. (2015). METefnet: developments in metrology for moisture in materials. In 17 International Congress of Metrology [15003] EDP Sciences. https://doi.org/10.1051/metrology/20150015003