METefnet

developments in metrology for moisture in materials

Stephanie Bell, Rudolf Aro, Fausto Arpino, Seda Aytekin, Gino Cortellessa, Marco Dell'Isola, Zuzana Ferenčíková, Vito Fernicola, Roberto Gavioso, Eric Georgin, Martti Heinonen, Domen Hudoklin, Luari Jalukse, Nuray Karaböce, Ivo Leito, Anssi Mäkynen, Peng Miao, Jan Nielsen, Ileana Nicolescu, Martina Rudolfová & 7 others Maija Ojanen-Saloranta, Petri Österberg, Peter Østergaard, Mihaela Rujan, Michela Sega, Radek Strnad, Tereza Vachova

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

3 Citations (Scopus)
Original languageEnglish
Title of host publication17 International Congress of Metrology
PublisherEDP Sciences
Number of pages8
DOIs
Publication statusPublished - 2015
MoE publication typeB3 Non-refereed article in conference proceedings
Event17th International Congress of Metrology, CIM 2015 - Paris, France
Duration: 21 Sep 201524 Sep 2015

Conference

Conference17th International Congress of Metrology, CIM 2015
Abbreviated titleCIM 2015
CountryFrance
CityParis
Period21/09/1524/09/15

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Keywords

  • moisture
  • solid materials
  • SI traceability

Cite this

Bell, S., Aro, R., Arpino, F., Aytekin, S., Cortellessa, G., Dell'Isola, M., ... Vachova, T. (2015). METefnet: developments in metrology for moisture in materials. In 17 International Congress of Metrology [15003] EDP Sciences. https://doi.org/10.1051/metrology/20150015003
Bell, Stephanie ; Aro, Rudolf ; Arpino, Fausto ; Aytekin, Seda ; Cortellessa, Gino ; Dell'Isola, Marco ; Ferenčíková, Zuzana ; Fernicola, Vito ; Gavioso, Roberto ; Georgin, Eric ; Heinonen, Martti ; Hudoklin, Domen ; Jalukse, Luari ; Karaböce, Nuray ; Leito, Ivo ; Mäkynen, Anssi ; Miao, Peng ; Nielsen, Jan ; Nicolescu, Ileana ; Rudolfová, Martina ; Ojanen-Saloranta, Maija ; Österberg, Petri ; Østergaard, Peter ; Rujan, Mihaela ; Sega, Michela ; Strnad, Radek ; Vachova, Tereza. / METefnet : developments in metrology for moisture in materials. 17 International Congress of Metrology. EDP Sciences, 2015.
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title = "METefnet: developments in metrology for moisture in materials",
keywords = "moisture, solid materials, SI traceability",
author = "Stephanie Bell and Rudolf Aro and Fausto Arpino and Seda Aytekin and Gino Cortellessa and Marco Dell'Isola and Zuzana Ferenč{\'i}kov{\'a} and Vito Fernicola and Roberto Gavioso and Eric Georgin and Martti Heinonen and Domen Hudoklin and Luari Jalukse and Nuray Karab{\"o}ce and Ivo Leito and Anssi M{\"a}kynen and Peng Miao and Jan Nielsen and Ileana Nicolescu and Martina Rudolfov{\'a} and Maija Ojanen-Saloranta and Petri {\"O}sterberg and Peter {\O}stergaard and Mihaela Rujan and Michela Sega and Radek Strnad and Tereza Vachova",
year = "2015",
doi = "10.1051/metrology/20150015003",
language = "English",
booktitle = "17 International Congress of Metrology",
publisher = "EDP Sciences",
address = "France",

}

Bell, S, Aro, R, Arpino, F, Aytekin, S, Cortellessa, G, Dell'Isola, M, Ferenčíková, Z, Fernicola, V, Gavioso, R, Georgin, E, Heinonen, M, Hudoklin, D, Jalukse, L, Karaböce, N, Leito, I, Mäkynen, A, Miao, P, Nielsen, J, Nicolescu, I, Rudolfová, M, Ojanen-Saloranta, M, Österberg, P, Østergaard, P, Rujan, M, Sega, M, Strnad, R & Vachova, T 2015, METefnet: developments in metrology for moisture in materials. in 17 International Congress of Metrology., 15003, EDP Sciences, 17th International Congress of Metrology, CIM 2015, Paris, France, 21/09/15. https://doi.org/10.1051/metrology/20150015003

METefnet : developments in metrology for moisture in materials. / Bell, Stephanie; Aro, Rudolf; Arpino, Fausto; Aytekin, Seda; Cortellessa, Gino; Dell'Isola, Marco; Ferenčíková, Zuzana; Fernicola, Vito; Gavioso, Roberto; Georgin, Eric; Heinonen, Martti; Hudoklin, Domen; Jalukse, Luari; Karaböce, Nuray; Leito, Ivo; Mäkynen, Anssi; Miao, Peng; Nielsen, Jan; Nicolescu, Ileana; Rudolfová, Martina; Ojanen-Saloranta, Maija; Österberg, Petri; Østergaard, Peter; Rujan, Mihaela; Sega, Michela; Strnad, Radek; Vachova, Tereza.

17 International Congress of Metrology. EDP Sciences, 2015. 15003.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

TY - GEN

T1 - METefnet

T2 - developments in metrology for moisture in materials

AU - Bell, Stephanie

AU - Aro, Rudolf

AU - Arpino, Fausto

AU - Aytekin, Seda

AU - Cortellessa, Gino

AU - Dell'Isola, Marco

AU - Ferenčíková, Zuzana

AU - Fernicola, Vito

AU - Gavioso, Roberto

AU - Georgin, Eric

AU - Heinonen, Martti

AU - Hudoklin, Domen

AU - Jalukse, Luari

AU - Karaböce, Nuray

AU - Leito, Ivo

AU - Mäkynen, Anssi

AU - Miao, Peng

AU - Nielsen, Jan

AU - Nicolescu, Ileana

AU - Rudolfová, Martina

AU - Ojanen-Saloranta, Maija

AU - Österberg, Petri

AU - Østergaard, Peter

AU - Rujan, Mihaela

AU - Sega, Michela

AU - Strnad, Radek

AU - Vachova, Tereza

PY - 2015

Y1 - 2015

KW - moisture

KW - solid materials

KW - SI traceability

U2 - 10.1051/metrology/20150015003

DO - 10.1051/metrology/20150015003

M3 - Conference article in proceedings

BT - 17 International Congress of Metrology

PB - EDP Sciences

ER -

Bell S, Aro R, Arpino F, Aytekin S, Cortellessa G, Dell'Isola M et al. METefnet: developments in metrology for moisture in materials. In 17 International Congress of Metrology. EDP Sciences. 2015. 15003 https://doi.org/10.1051/metrology/20150015003