METefnet: developments in metrology for moisture in materials

Stephanie Bell; Rudolf Aro; Fausto Arpino; Seda Aytekin; Gino Cortellessa; Marco Dell'Isola; Zuzana Ferenčíková; Vito Fernicola; Roberto Gavioso; Eric Georgin; Martti Heinonen; Domen Hudoklin; Luari Jalukse; Nuray Karaböce; Ivo Leito; Anssi Mäkynen; Peng Miao; Jan Nielsen; Ileana Nicolescu; Martina Rudolfová; Maija Ojanen-Saloranta; Petri Österberg; Peter Østergaard; Mihaela Rujan; Michela Sega; Radek Strnad; Tereza Vachova

doi:10.1051/metrology/20150015003

METefnet: developments in metrology for moisture in materials

Stephanie Bell
, Rudolf Aro
, Fausto Arpino
, Seda Aytekin
, Gino Cortellessa
, Marco Dell'Isola
, Zuzana Ferenčíková
, Vito Fernicola
, Roberto Gavioso
, Eric Georgin
, Martti Heinonen
, Domen Hudoklin
, Luari Jalukse
, Nuray Karaböce
, Ivo Leito
, Anssi Mäkynen
, Peng Miao
, Jan Nielsen
, Ileana Nicolescu
, Martina Rudolfová

Maija Ojanen-Saloranta, Petri Österberg, Peter Østergaard, Mihaela Rujan, Michela Sega, Radek Strnad, Tereza Vachova

National Physics Laboratory (NPL)
University of Tartu
Università degli Studi di Cassino e del Lazio Meridionale
TÜBİTAK National Metrology Institute (UME)
Czech Metrology Institute (CMI)
National Metrological Institute (INRIM)
Centre Technique des Industries Aérauliques et Thermiques (CETIAT)
University of Ljubljana
University of Oulu
Danish Technological Institute (DTI)
National Institute of Metrology (INM)

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

4 Citations (Scopus)

Original language	English
Title of host publication	17 International Congress of Metrology
Publisher	EDP Sciences
Number of pages	8
DOIs	https://doi.org/10.1051/metrology/20150015003
Publication status	Published - 2015
MoE publication type	B3 Non-refereed article in conference proceedings
Event	17th International Congress of Metrology, CIM 2015 - Paris, France Duration: 21 Sept 2015 → 24 Sept 2015

Conference

Conference	17th International Congress of Metrology, CIM 2015
Abbreviated title	CIM 2015
Country/Territory	France
City	Paris
Period	21/09/15 → 24/09/15

Keywords

moisture
solid materials
SI traceability

Access to Document

10.1051/metrology/20150015003

Cite this

Bell, S., Aro, R., Arpino, F., Aytekin, S., Cortellessa, G., Dell'Isola, M., Ferenčíková, Z., Fernicola, V., Gavioso, R., Georgin, E., Heinonen, M., Hudoklin, D., Jalukse, L., Karaböce, N., Leito, I., Mäkynen, A., Miao, P., Nielsen, J., Nicolescu, I., ... Vachova, T. (2015). METefnet: developments in metrology for moisture in materials. In 17 International Congress of Metrology Article 15003 EDP Sciences. https://doi.org/10.1051/metrology/20150015003

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title = "METefnet: developments in metrology for moisture in materials",

keywords = "moisture, solid materials, SI traceability",

author = "Stephanie Bell and Rudolf Aro and Fausto Arpino and Seda Aytekin and Gino Cortellessa and Marco Dell'Isola and Zuzana Feren{\v c}{\'i}kov{\'a} and Vito Fernicola and Roberto Gavioso and Eric Georgin and Martti Heinonen and Domen Hudoklin and Luari Jalukse and Nuray Karab{\"o}ce and Ivo Leito and Anssi M{\"a}kynen and Peng Miao and Jan Nielsen and Ileana Nicolescu and Martina Rudolfov{\'a} and Maija Ojanen-Saloranta and Petri {\"O}sterberg and Peter {\O}stergaard and Mihaela Rujan and Michela Sega and Radek Strnad and Tereza Vachova",

year = "2015",

doi = "10.1051/metrology/20150015003",

language = "English",

booktitle = "17 International Congress of Metrology",

publisher = "EDP Sciences",

address = "France",

note = "17th International Congress of Metrology, CIM 2015, CIM 2015 ; Conference date: 21-09-2015 Through 24-09-2015",

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Bell, S, Aro, R, Arpino, F, Aytekin, S, Cortellessa, G, Dell'Isola, M, Ferenčíková, Z, Fernicola, V, Gavioso, R, Georgin, E, Heinonen, M, Hudoklin, D, Jalukse, L, Karaböce, N, Leito, I, Mäkynen, A, Miao, P, Nielsen, J, Nicolescu, I, Rudolfová, M, Ojanen-Saloranta, M, Österberg, P, Østergaard, P, Rujan, M, Sega, M, Strnad, R & Vachova, T 2015, METefnet: developments in metrology for moisture in materials. in 17 International Congress of Metrology., 15003, EDP Sciences, 17th International Congress of Metrology, CIM 2015, Paris, France, 21/09/15. https://doi.org/10.1051/metrology/20150015003

TY - GEN

T1 - METefnet

T2 - 17th International Congress of Metrology, CIM 2015

AU - Bell, Stephanie

AU - Aro, Rudolf

AU - Arpino, Fausto

AU - Aytekin, Seda

AU - Cortellessa, Gino

AU - Dell'Isola, Marco

AU - Ferenčíková, Zuzana

AU - Fernicola, Vito

AU - Gavioso, Roberto

AU - Georgin, Eric

AU - Heinonen, Martti

AU - Hudoklin, Domen

AU - Jalukse, Luari

AU - Karaböce, Nuray

AU - Leito, Ivo

AU - Mäkynen, Anssi

AU - Miao, Peng

AU - Nielsen, Jan

AU - Nicolescu, Ileana

AU - Rudolfová, Martina

AU - Ojanen-Saloranta, Maija

AU - Österberg, Petri

AU - Østergaard, Peter

AU - Rujan, Mihaela

AU - Sega, Michela

AU - Strnad, Radek

AU - Vachova, Tereza

PY - 2015

Y1 - 2015

KW - moisture

KW - solid materials

KW - SI traceability

U2 - 10.1051/metrology/20150015003

DO - 10.1051/metrology/20150015003

M3 - Conference article in proceedings

BT - 17 International Congress of Metrology

PB - EDP Sciences

Y2 - 21 September 2015 through 24 September 2015

ER -