Method and apparatus for measuring the height of a surface

Kai Ojala (Inventor)

Research output: PatentResearch

Abstract

A measuring device includes an illuminating unit arranged to project an illuminating light beam on a surface of a target object so as to form an illuminated region on the surface, an image sensor, and focusing optics arranged to form a focused spot on the image sensor by focusing light reflected from the illuminated region such that the position of the spot depends on the height of the surface with respect to a reference plane, wherein the device is configured to determine a height of the surface from a detected position of the focused spot, and wherein the normal of the image sensor is inclined with respect to the optical axis of the focusing optics.
Original languageEnglish
Patent number US2018252516A
IPCG01B 11/24,G01B11/06,G02B13/22,G02B27/42
Priority date22/09/15
Filing date6/09/18
Publication statusPublished - 6 Sep 2018
MoE publication typeNot Eligible

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illuminating
sensors
optics
light beams

Cite this

Ojala, K. (2018). IPC No. G01B 11/24, G01B11/06, G02B13/22, G02B27/42. Method and apparatus for measuring the height of a surface. (Patent No. US2018252516A). VTT Technical Research Centre of Finland.
Ojala, Kai (Inventor). / Method and apparatus for measuring the height of a surface. VTT Technical Research Centre of Finland. IPC No.: G01B 11/24, G01B11/06, G02B13/22, G02B27/42. Patent No.: US2018252516A. Sep 06, 2018.
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Ojala, K Sep. 06 2018, Method and apparatus for measuring the height of a surface, Patent No. US2018252516A, IPC No. G01B 11/24, G01B11/06, G02B13/22, G02B27/42.

Method and apparatus for measuring the height of a surface. / Ojala, Kai (Inventor).

VTT Technical Research Centre of Finland. IPC No.: G01B 11/24, G01B11/06, G02B13/22, G02B27/42. Patent No.: US2018252516A. Sep 06, 2018.

Research output: PatentResearch

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Ojala K, inventor. Method and apparatus for measuring the height of a surface. G01B 11/24, G01B11/06, G02B13/22, G02B27/42. 2018 Sep 6.