Abstract
The invention relates to a method and system and microchip for determining impedance of a variable impedance component. The method comprises tuning a tunable oscillator over a predefined tuning range, the tunable oscillator having the variable impedance component coupled as a load thereof. The frequency response of the tunable oscillator is measured as a function of said tuning. Finally, the measured frequency response is analyzed for determining the impedance of the variable impedance component. The invention makes possible to manufacture smaller and simpler monolithic sensor microchips.
Patent family as of 7.9.2021
CN101685116B 20171027 CN200910166921 20090701
DE602009060738D1 20200109 DE200960060738T 20090630
EP2141495 A2 20100106 EP20090164118 20090630
EP2141495 A3 20130306 EP20090164118 20090630
EP2141495 B1 20191218 EP20090164118 20090630
FI121898 B 20110531 FI20080005682 20080701
FI20085682 A 20100102 FI20080005682 20080701
FI20085682 A0 20080701 FI20080005682 20080701
US2010001740 AA 20100107 US20090495267 20090630
US8120434 BB 20120221 US20090495267 20090630
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Original language | English |
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Patent number | EP2141495 |
IPC | G01N 29/ 24 A I |
Priority date | 1/07/08 |
Publication status | Published - 6 Jan 2010 |
MoE publication type | H1 Granted patent |