Methods for Electrical Cooling and Thermometry of a Suspended Silicon Chip

Antti Kemppinen; Emma Mykkänen; Janne Lehtinen; Andrey Shchepetov; Andrey Timofeev; D. Gunnarsson; Leif Grönberg; Antti Manninen; Mika Prunnila

doi:10.1109/CPEM.2018.8500953

Methods for Electrical Cooling and Thermometry of a Suspended Silicon Chip

Antti Kemppinen, Emma Mykkänen, Janne Lehtinen, Andrey Shchepetov, Andrey Timofeev, D. Gunnarsson, Leif Grönberg, Antti Manninen, Mika Prunnila

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

We suspend a heavily doped conducting silicon chip by tunnel junctions and aluminum leads, which permits the measurement and control of electrical and phonon heat fluxes. Experiments and analysis on heat conduction and electrical cooling utilize techniques developed for electron pumps and primary thermometry, and the techniques developed for the cooler may also be useful for the development quantum phase slip based devices.

Original language	English
Title of host publication	CPEM 2018 - Conference on Precision Electromagnetic Measurements
Publisher	IEEE Institute of Electrical and Electronic Engineers
Number of pages	2
ISBN (Electronic)	978-1-5386-0974-3, 978-1-5386-0973-6
DOIs	https://doi.org/10.1109/CPEM.2018.8500953
Publication status	Published - 2018
MoE publication type	Not Eligible
Event	Conference on Precision Electromagnetic Measurements, CPEM 2018 - Paris, France Duration: 8 Jul 2018 → 13 Jul 2018

Conference

Conference	Conference on Precision Electromagnetic Measurements, CPEM 2018
Abbreviated title	CPEM
Country	France
City	Paris
Period	8/07/18 → 13/07/18

Keywords

Cryogenics
electrical cooling
quantum standard
thermometry
OtaNano

Access to Document

10.1109/CPEM.2018.8500953

Link to publication in Scopus

Fingerprint Dive into the research topics of 'Methods for Electrical Cooling and Thermometry of a Suspended Silicon Chip'. Together they form a unique fingerprint.

Equipment

OtaNano

VTT Technical Research Centre of Finland

Facility/equipment: Facility

Cite this

Kemppinen, A., Mykkänen, E., Lehtinen, J., Shchepetov, A., Timofeev, A., Gunnarsson, D., Grönberg, L., Manninen, A., & Prunnila, M. (2018). Methods for Electrical Cooling and Thermometry of a Suspended Silicon Chip. In CPEM 2018 - Conference on Precision Electromagnetic Measurements IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/CPEM.2018.8500953

Kemppinen, Antti ; Mykkänen, Emma ; Lehtinen, Janne ; Shchepetov, Andrey ; Timofeev, Andrey ; Gunnarsson, D. ; Grönberg, Leif ; Manninen, Antti ; Prunnila, Mika. / Methods for Electrical Cooling and Thermometry of a Suspended Silicon Chip. CPEM 2018 - Conference on Precision Electromagnetic Measurements. IEEE Institute of Electrical and Electronic Engineers, 2018.

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title = "Methods for Electrical Cooling and Thermometry of a Suspended Silicon Chip",

abstract = "We suspend a heavily doped conducting silicon chip by tunnel junctions and aluminum leads, which permits the measurement and control of electrical and phonon heat fluxes. Experiments and analysis on heat conduction and electrical cooling utilize techniques developed for electron pumps and primary thermometry, and the techniques developed for the cooler may also be useful for the development quantum phase slip based devices.",

keywords = "Cryogenics, electrical cooling, quantum standard, thermometry, OtaNano",

author = "Antti Kemppinen and Emma Mykk{\"a}nen and Janne Lehtinen and Andrey Shchepetov and Andrey Timofeev and D. Gunnarsson and Leif Gr{\"o}nberg and Antti Manninen and Mika Prunnila",

note = "Extended abstract; Conference on Precision Electromagnetic Measurements, CPEM 2018, CPEM ; Conference date: 08-07-2018 Through 13-07-2018",

year = "2018",

doi = "10.1109/CPEM.2018.8500953",

language = "English",

booktitle = "CPEM 2018 - Conference on Precision Electromagnetic Measurements",

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Kemppinen, A , Mykkänen, E , Lehtinen, J, Shchepetov, A, Timofeev, A, Gunnarsson, D, Grönberg, L , Manninen, A & Prunnila, M 2018, Methods for Electrical Cooling and Thermometry of a Suspended Silicon Chip. in CPEM 2018 - Conference on Precision Electromagnetic Measurements. IEEE Institute of Electrical and Electronic Engineers, Conference on Precision Electromagnetic Measurements, CPEM 2018, Paris, France, 8/07/18. https://doi.org/10.1109/CPEM.2018.8500953

Methods for Electrical Cooling and Thermometry of a Suspended Silicon Chip. / Kemppinen, Antti ; Mykkänen, Emma ; Lehtinen, Janne; Shchepetov, Andrey; Timofeev, Andrey; Gunnarsson, D.; Grönberg, Leif ; Manninen, Antti ; Prunnila, Mika.

CPEM 2018 - Conference on Precision Electromagnetic Measurements. IEEE Institute of Electrical and Electronic Engineers, 2018.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

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AU - Kemppinen, Antti

AU - Mykkänen, Emma

AU - Lehtinen, Janne

AU - Shchepetov, Andrey

AU - Timofeev, Andrey

AU - Gunnarsson, D.

AU - Grönberg, Leif

AU - Manninen, Antti

AU - Prunnila, Mika

N1 - Extended abstract

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N2 - We suspend a heavily doped conducting silicon chip by tunnel junctions and aluminum leads, which permits the measurement and control of electrical and phonon heat fluxes. Experiments and analysis on heat conduction and electrical cooling utilize techniques developed for electron pumps and primary thermometry, and the techniques developed for the cooler may also be useful for the development quantum phase slip based devices.

AB - We suspend a heavily doped conducting silicon chip by tunnel junctions and aluminum leads, which permits the measurement and control of electrical and phonon heat fluxes. Experiments and analysis on heat conduction and electrical cooling utilize techniques developed for electron pumps and primary thermometry, and the techniques developed for the cooler may also be useful for the development quantum phase slip based devices.

KW - Cryogenics

KW - electrical cooling

KW - quantum standard

KW - thermometry

KW - OtaNano

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DO - 10.1109/CPEM.2018.8500953

M3 - Conference article in proceedings

BT - CPEM 2018 - Conference on Precision Electromagnetic Measurements

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - Conference on Precision Electromagnetic Measurements, CPEM 2018

Y2 - 8 July 2018 through 13 July 2018

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