Methods for on-wafer testing of cryogenic integrated circuits at millimetre waves

Jussi Tuovinen, Jussi Varis, Manu Lahdes, Hannu Hakojärvi

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publication4th European Workshop on Low Temperature Electronics - WOLTE 4
    Subtitle of host publicationNoordwijk, the Netherlands, 21-23 June 2000
    PublisherEuropean Space Agency (ESA)
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication

    Publication series

    SeriesESA Conference Proceedings

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