Methods for on-wafer testing of cryogenic integrated circuits at millimetre waves

Jussi Tuovinen, Jussi Varis, Manu Lahdes, Hannu Hakojärvi

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publication4th European Workshop on Low Temperature Electronics - WOLTE 4
    Subtitle of host publicationNoordwijk, the Netherlands, 21-23 June 2000
    PublisherEuropean Space Agency ESA
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication

    Publication series

    SeriesESA Conference Proceedings
    NumberWPP-171
    ISSN1022-6656

    Cite this

    Tuovinen, J., Varis, J., Lahdes, M., & Hakojärvi, H. (2000). Methods for on-wafer testing of cryogenic integrated circuits at millimetre waves. In 4th European Workshop on Low Temperature Electronics - WOLTE 4: Noordwijk, the Netherlands, 21-23 June 2000 European Space Agency ESA. ESA Conference Proceedings, No. WPP-171