Methods for on-wafer testing of cryogenic integrated circuits at millimetre waves

Jussi Tuovinen, Jussi Varis, Manu Lahdes, Hannu Hakojärvi

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	4th European Workshop on Low Temperature Electronics - WOLTE 4
Subtitle of host publication	Noordwijk, the Netherlands, 21-23 June 2000
Publisher	European Space Agency (ESA)
Publication status	Published - 2000
MoE publication type	A4 Article in a conference publication

Cite this

@inproceedings{1c567f89e8fc4bc998fd9c531ca75d23,

title = "Methods for on-wafer testing of cryogenic integrated circuits at millimetre waves",

author = "Jussi Tuovinen and Jussi Varis and Manu Lahdes and Hannu Hakoj{\"a}rvi",

year = "2000",

language = "English",

series = "ESA Conference Proceedings",

publisher = "European Space Agency (ESA)",

number = "WPP-171",

booktitle = "4th European Workshop on Low Temperature Electronics - WOLTE 4",

address = "France",

}

Methods for on-wafer testing of cryogenic integrated circuits at millimetre waves. / Tuovinen, Jussi; Varis, Jussi ; Lahdes, Manu et al.
4th European Workshop on Low Temperature Electronics - WOLTE 4: Noordwijk, the Netherlands, 21-23 June 2000. European Space Agency (ESA), 2000. (ESA Conference Proceedings; No. WPP-171).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Methods for on-wafer testing of cryogenic integrated circuits at millimetre waves

AU - Tuovinen, Jussi

AU - Varis, Jussi

AU - Lahdes, Manu

AU - Hakojärvi, Hannu

PY - 2000

Y1 - 2000

M3 - Conference article in proceedings

T3 - ESA Conference Proceedings

BT - 4th European Workshop on Low Temperature Electronics - WOLTE 4

PB - European Space Agency (ESA)

ER -