Metrological characterization methods for confocal chromatic line sensors and optical topography sensors

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Abstract

The increasing use of chromatic confocal technology for, e.g. fast, in-line optical topography, and measuring thickness, roughness and profiles implies a need for the characterization of various aspects of the sensors. Single-point, line and matrix versions of chromatic confocal technology, encoding depth information into wavelength, have been developed. Of these, line sensors are particularly suitable for in-line process measurement. Metrological characterization and development of practical methods for calibration and checking is needed for new optical methods and devices. Compared to, e.g. tactile methods, optical topography measurement techniques have limitations related to light wavelength and coherence, optical properties of the sample including reflectivity, specularity, roughness and colour, and definition of optical versus mechanical surfaces. In this work, metrological characterization methods for optical line sensors were developed for scale magnification and linearity, sensitivity to sample properties, and dynamic characteristics. An accurate depth scale calibration method using a single prototype groove depth sample was developed for a line sensor and validated with laser-interferometric sample tracking, attaining (sub)micrometre level or better than 0.1% scale accuracy. Furthermore, the effect of different surfaces and materials on the measurement and depth scale was studied, in particular slope angle, specularity and colour. In addition, dynamic performance, noise, lateral scale and resolution were measured using the developed methods. In the case of the LCI1200 sensor used in this study, which has a 11.3 mm × 2.8 mm measurement range, the instrument depth scale was found to depend only minimally on sample colour, whereas measuring steeply sloped specular surfaces in the peripheral measurement area, in the worst case, caused a somewhat larger relative sample-dependent change (1%) in scale.

Original languageEnglish
Article number054008
JournalMeasurement Science and Technology
Volume29
Issue number5
DOIs
Publication statusPublished - 9 Apr 2018
MoE publication typeA1 Journal article-refereed

Fingerprint

Confocal
Topography
topography
Sensor
Line
sensors
Sensors
Color
Surface roughness
Calibration
color
Roughness
Wavelength
roughness
optics
Dynamic Performance
Measurement Techniques
rangefinding
Optical properties
Reflectivity

Keywords

  • calibration
  • metrology
  • optical scanners
  • optical sensors

Cite this

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title = "Metrological characterization methods for confocal chromatic line sensors and optical topography sensors",
abstract = "The increasing use of chromatic confocal technology for, e.g. fast, in-line optical topography, and measuring thickness, roughness and profiles implies a need for the characterization of various aspects of the sensors. Single-point, line and matrix versions of chromatic confocal technology, encoding depth information into wavelength, have been developed. Of these, line sensors are particularly suitable for in-line process measurement. Metrological characterization and development of practical methods for calibration and checking is needed for new optical methods and devices. Compared to, e.g. tactile methods, optical topography measurement techniques have limitations related to light wavelength and coherence, optical properties of the sample including reflectivity, specularity, roughness and colour, and definition of optical versus mechanical surfaces. In this work, metrological characterization methods for optical line sensors were developed for scale magnification and linearity, sensitivity to sample properties, and dynamic characteristics. An accurate depth scale calibration method using a single prototype groove depth sample was developed for a line sensor and validated with laser-interferometric sample tracking, attaining (sub)micrometre level or better than 0.1{\%} scale accuracy. Furthermore, the effect of different surfaces and materials on the measurement and depth scale was studied, in particular slope angle, specularity and colour. In addition, dynamic performance, noise, lateral scale and resolution were measured using the developed methods. In the case of the LCI1200 sensor used in this study, which has a 11.3 mm × 2.8 mm measurement range, the instrument depth scale was found to depend only minimally on sample colour, whereas measuring steeply sloped specular surfaces in the peripheral measurement area, in the worst case, caused a somewhat larger relative sample-dependent change (1{\%}) in scale.",
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Metrological characterization methods for confocal chromatic line sensors and optical topography sensors. / Seppä, Jeremias; Niemelä, Karri; Lassila, Antti.

In: Measurement Science and Technology, Vol. 29, No. 5, 054008, 09.04.2018.

Research output: Contribution to journalArticleScientificpeer-review

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T1 - Metrological characterization methods for confocal chromatic line sensors and optical topography sensors

AU - Seppä, Jeremias

AU - Niemelä, Karri

AU - Lassila, Antti

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