Abstract
Instrumentation of particle physics requires precisely engineered structures. Reliable quality assurance of detectors by calibrated tools is crucial. We developed and microfabricated transfer standards for lateral calibration of an optical scanning system employed for quality assurance of particle detectors. The standard was embodied as an array of cavities of specified depths and shapes. The fabrication involved common wet and dry silicon etching methods. The fabricated standards brought better than 2 µm lateral precision to rapid nondestructive QA work.
Original language | English |
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Title of host publication | 24th Micromechanics and Microsystems Europe Conference (MME 2013) |
Place of Publication | Espoo |
Publication status | Published - 2013 |
MoE publication type | A4 Article in a conference publication |
Event | 24th Micromechanics and Microsystems Europe Conference - Espoo, Finland Duration: 1 Sept 2013 → 4 Sept 2013 |
Conference
Conference | 24th Micromechanics and Microsystems Europe Conference |
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Country/Territory | Finland |
City | Espoo |
Period | 1/09/13 → 4/09/13 |