Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 839-849 |
| Number of pages | 11 |
| Journal | Materials Science-Poland |
| Volume | 26 |
| Issue number | 4 |
| Publication status | Published - 2008 |
| MoE publication type | A1 Journal article-refereed |
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Keywords
- magnetic domain
- magnetization reversal
- perpendicular anisotropy
- anisotropy
- magnetic anisotropy
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Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers. / Czapkiewicz, M.; Kanak, J.; Stobiecki, T.; Kachel, M.; Zoladz, M.; Sveklo, I.; Maziewski, A.; Van Dijken, Sebastiaan.
In: Materials Science-Poland, Vol. 26, No. 4, 2008, p. 839-849.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers
AU - Czapkiewicz, M.
AU - Kanak, J.
AU - Stobiecki, T.
AU - Kachel, M.
AU - Zoladz, M.
AU - Sveklo, I.
AU - Maziewski, A.
AU - Van Dijken, Sebastiaan
PY - 2008
Y1 - 2008
N2 - A study on the buffer layer dependence of the film texture, surface roughness, and magnetization re-versal process in Co/Pt multilayers prepared by dc magnetron sputtering is presented. Oxidized Si(100) wafer was covered with four different buffers: (A) 10 nm Cu, (B) 5 nm Ta/10 nm Cu, (C) 5 nm Ta/10 nm Cu/5 nm Ta, and (D) 5 nm Ta/10 nm Cu/5 nm Ta/10 nm Cu. The growth of [2 nm Pt/0.5 nm Co]×5/2 nm Pt on top of these buffer layers results in a large variation in the fcc (111) Co/Pt texture and surface mor-phology. All films have the perpendicular magnetic anisotropy but magnetization reversal process, stud-ied by the magnetooptic Kerr effect (MOKE) and magnetic force spectroscopy (MFM), strongly depends on the buffer used. Observation of magnetic domains evolution under a MOKE microscope allows one to calculate from magnetization relaxation curves average dispersion of energy barriers of the thermal acti-vated magnetization switching process. The application of MFM in external magnetic field allows one to follow the dynamics of direct and indirect magnetization switching procesess up to submicrometer scale.
AB - A study on the buffer layer dependence of the film texture, surface roughness, and magnetization re-versal process in Co/Pt multilayers prepared by dc magnetron sputtering is presented. Oxidized Si(100) wafer was covered with four different buffers: (A) 10 nm Cu, (B) 5 nm Ta/10 nm Cu, (C) 5 nm Ta/10 nm Cu/5 nm Ta, and (D) 5 nm Ta/10 nm Cu/5 nm Ta/10 nm Cu. The growth of [2 nm Pt/0.5 nm Co]×5/2 nm Pt on top of these buffer layers results in a large variation in the fcc (111) Co/Pt texture and surface mor-phology. All films have the perpendicular magnetic anisotropy but magnetization reversal process, stud-ied by the magnetooptic Kerr effect (MOKE) and magnetic force spectroscopy (MFM), strongly depends on the buffer used. Observation of magnetic domains evolution under a MOKE microscope allows one to calculate from magnetization relaxation curves average dispersion of energy barriers of the thermal acti-vated magnetization switching process. The application of MFM in external magnetic field allows one to follow the dynamics of direct and indirect magnetization switching procesess up to submicrometer scale.
KW - magnetic domain
KW - magnetization reversal
KW - perpendicular anisotropy
KW - anisotropy
KW - magnetic anisotropy
M3 - Article
VL - 26
SP - 839
EP - 849
JO - Materials Science-Poland
JF - Materials Science-Poland
SN - 2083-1331
IS - 4
ER -