Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers

M. Czapkiewicz, J. Kanak, T. Stobiecki, M. Kachel, M. Zoladz, I. Sveklo, A. Maziewski, Sebastiaan Van Dijken

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Abstract

A study on the buffer layer dependence of the film texture, surface roughness, and magnetization re-versal process in Co/Pt multilayers prepared by dc magnetron sputtering is presented. Oxidized Si(100) wafer was covered with four different buffers: (A) 10 nm Cu, (B) 5 nm Ta/10 nm Cu, (C) 5 nm Ta/10 nm Cu/5 nm Ta, and (D) 5 nm Ta/10 nm Cu/5 nm Ta/10 nm Cu. The growth of [2 nm Pt/0.5 nm Co]×5/2 nm Pt on top of these buffer layers results in a large variation in the fcc (111) Co/Pt texture and surface mor-phology. All films have the perpendicular magnetic anisotropy but magnetization reversal process, stud-ied by the magnetooptic Kerr effect (MOKE) and magnetic force spectroscopy (MFM), strongly depends on the buffer used. Observation of magnetic domains evolution under a MOKE microscope allows one to calculate from magnetization relaxation curves average dispersion of energy barriers of the thermal acti-vated magnetization switching process. The application of MFM in external magnetic field allows one to follow the dynamics of direct and indirect magnetization switching procesess up to submicrometer scale.
Original languageEnglish
Pages (from-to)839-849
Number of pages11
JournalMaterials Science-Poland
Volume26
Issue number4
Publication statusPublished - 2008
MoE publication typeA1 Journal article-refereed

Fingerprint

Buffer layers
Magnetization
Multilayers
buffers
magnetization
Magnetooptical effects
magnetic force microscopy
Buffers
Kerr effects
Textures
Magnetization reversal
textures
Magnetic domains
Magnetic anisotropy
Energy barriers
Magnetron sputtering
magnetic domains
Microscopes
Surface roughness
Spectroscopy

Keywords

  • magnetic domain
  • magnetization reversal
  • perpendicular anisotropy
  • anisotropy
  • magnetic anisotropy

Cite this

Czapkiewicz, M., Kanak, J., Stobiecki, T., Kachel, M., Zoladz, M., Sveklo, I., ... Van Dijken, S. (2008). Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers. Materials Science-Poland, 26(4), 839-849.
Czapkiewicz, M. ; Kanak, J. ; Stobiecki, T. ; Kachel, M. ; Zoladz, M. ; Sveklo, I. ; Maziewski, A. ; Van Dijken, Sebastiaan. / Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers. In: Materials Science-Poland. 2008 ; Vol. 26, No. 4. pp. 839-849.
@article{79834d3cf25a46dabee79e6d4cbeb09c,
title = "Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers",
abstract = "A study on the buffer layer dependence of the film texture, surface roughness, and magnetization re-versal process in Co/Pt multilayers prepared by dc magnetron sputtering is presented. Oxidized Si(100) wafer was covered with four different buffers: (A) 10 nm Cu, (B) 5 nm Ta/10 nm Cu, (C) 5 nm Ta/10 nm Cu/5 nm Ta, and (D) 5 nm Ta/10 nm Cu/5 nm Ta/10 nm Cu. The growth of [2 nm Pt/0.5 nm Co]×5/2 nm Pt on top of these buffer layers results in a large variation in the fcc (111) Co/Pt texture and surface mor-phology. All films have the perpendicular magnetic anisotropy but magnetization reversal process, stud-ied by the magnetooptic Kerr effect (MOKE) and magnetic force spectroscopy (MFM), strongly depends on the buffer used. Observation of magnetic domains evolution under a MOKE microscope allows one to calculate from magnetization relaxation curves average dispersion of energy barriers of the thermal acti-vated magnetization switching process. The application of MFM in external magnetic field allows one to follow the dynamics of direct and indirect magnetization switching procesess up to submicrometer scale.",
keywords = "magnetic domain, magnetization reversal, perpendicular anisotropy, anisotropy, magnetic anisotropy",
author = "M. Czapkiewicz and J. Kanak and T. Stobiecki and M. Kachel and M. Zoladz and I. Sveklo and A. Maziewski and {Van Dijken}, Sebastiaan",
year = "2008",
language = "English",
volume = "26",
pages = "839--849",
journal = "Materials Science-Poland",
issn = "2083-1331",
publisher = "De Gruyter",
number = "4",

}

Czapkiewicz, M, Kanak, J, Stobiecki, T, Kachel, M, Zoladz, M, Sveklo, I, Maziewski, A & Van Dijken, S 2008, 'Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers', Materials Science-Poland, vol. 26, no. 4, pp. 839-849.

Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers. / Czapkiewicz, M.; Kanak, J.; Stobiecki, T.; Kachel, M.; Zoladz, M.; Sveklo, I.; Maziewski, A.; Van Dijken, Sebastiaan.

In: Materials Science-Poland, Vol. 26, No. 4, 2008, p. 839-849.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers

AU - Czapkiewicz, M.

AU - Kanak, J.

AU - Stobiecki, T.

AU - Kachel, M.

AU - Zoladz, M.

AU - Sveklo, I.

AU - Maziewski, A.

AU - Van Dijken, Sebastiaan

PY - 2008

Y1 - 2008

N2 - A study on the buffer layer dependence of the film texture, surface roughness, and magnetization re-versal process in Co/Pt multilayers prepared by dc magnetron sputtering is presented. Oxidized Si(100) wafer was covered with four different buffers: (A) 10 nm Cu, (B) 5 nm Ta/10 nm Cu, (C) 5 nm Ta/10 nm Cu/5 nm Ta, and (D) 5 nm Ta/10 nm Cu/5 nm Ta/10 nm Cu. The growth of [2 nm Pt/0.5 nm Co]×5/2 nm Pt on top of these buffer layers results in a large variation in the fcc (111) Co/Pt texture and surface mor-phology. All films have the perpendicular magnetic anisotropy but magnetization reversal process, stud-ied by the magnetooptic Kerr effect (MOKE) and magnetic force spectroscopy (MFM), strongly depends on the buffer used. Observation of magnetic domains evolution under a MOKE microscope allows one to calculate from magnetization relaxation curves average dispersion of energy barriers of the thermal acti-vated magnetization switching process. The application of MFM in external magnetic field allows one to follow the dynamics of direct and indirect magnetization switching procesess up to submicrometer scale.

AB - A study on the buffer layer dependence of the film texture, surface roughness, and magnetization re-versal process in Co/Pt multilayers prepared by dc magnetron sputtering is presented. Oxidized Si(100) wafer was covered with four different buffers: (A) 10 nm Cu, (B) 5 nm Ta/10 nm Cu, (C) 5 nm Ta/10 nm Cu/5 nm Ta, and (D) 5 nm Ta/10 nm Cu/5 nm Ta/10 nm Cu. The growth of [2 nm Pt/0.5 nm Co]×5/2 nm Pt on top of these buffer layers results in a large variation in the fcc (111) Co/Pt texture and surface mor-phology. All films have the perpendicular magnetic anisotropy but magnetization reversal process, stud-ied by the magnetooptic Kerr effect (MOKE) and magnetic force spectroscopy (MFM), strongly depends on the buffer used. Observation of magnetic domains evolution under a MOKE microscope allows one to calculate from magnetization relaxation curves average dispersion of energy barriers of the thermal acti-vated magnetization switching process. The application of MFM in external magnetic field allows one to follow the dynamics of direct and indirect magnetization switching procesess up to submicrometer scale.

KW - magnetic domain

KW - magnetization reversal

KW - perpendicular anisotropy

KW - anisotropy

KW - magnetic anisotropy

M3 - Article

VL - 26

SP - 839

EP - 849

JO - Materials Science-Poland

JF - Materials Science-Poland

SN - 2083-1331

IS - 4

ER -

Czapkiewicz M, Kanak J, Stobiecki T, Kachel M, Zoladz M, Sveklo I et al. Micromagnetic properties of Co/Pt multilayers deposited on various buffer layers. Materials Science-Poland. 2008;26(4):839-849.