Abstract
In this paper, we describe the development of a
millimeter-wave reflectarray intended for use in a
millimeter-wave identification or imaging applications.
Design, simulations, and millimeter-wave near-field
measurements of the reflectarray are presented. An
in-house genetic algorithm is used in determining the
required phase shift by the reflectarray elements. The
elements are realized in a lithographic process and are
based on a conductor-backed coplanar waveguide patch
antennas with a phase shifter attached to them. Prior the
fabrication, the element is optimized based on full-wave
simulations. Static 120-GHz offset-fed reflectarrays
preceding the active ones have been fabricated and
characterized at millimeter-wave near-field measurement
range. With these prototypes, the feasibility of both the
genetic algorithm and the fabrication process is proven
successful, although in some part some iteration will
still be required. The measured beam patterns of the
reflectarray are in line with theoretical predictions
given by the genetic algorithm when unidealities of the
reflectarrays are taken into account.
Original language | English |
---|---|
Title of host publication | Proceedings |
Subtitle of host publication | 2012 7th European Microwave Integrated Circuit Conference, EuMIC2012 |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 219-222 |
Volume | 1 |
ISBN (Electronic) | 978-2-87487-028-6 |
ISBN (Print) | 978-1-4673-2302-4 |
Publication status | Published - 2012 |
MoE publication type | A4 Article in a conference publication |
Event | 7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 - Amsterdam, Netherlands Duration: 29 Oct 2012 → 30 Oct 2012 https://ieeexplore.ieee.org/xpl/conhome/6476772/proceeding (Proceedings) |
Conference
Conference | 7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 |
---|---|
Abbreviated title | EUMiC 2012 |
Country/Territory | Netherlands |
City | Amsterdam |
Period | 29/10/12 → 30/10/12 |
Internet address |
Keywords
- beam steering
- microelectromechanical system
- millimeter-wave
- near-field measurements
- reflectarray