Millimeter-wave reflectarray for beam-steering applications

A. Tamminen, J. Ala-Laurinto, S. Mäkelä, A.V. Räisänen, David Gomes Martins, Janne Häkli, Päivi Koivisto, Pekka Rantakari, Jussi Säily, Reijo Tuovinen, Arttu Luukanen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Abstract

    In this paper, we describe the development of a millimeter-wave reflectarray intended for use in a millimeter-wave identification or imaging applications. Design, simulations, and millimeter-wave near-field measurements of the reflectarray are presented. An in-house genetic algorithm is used in determining the required phase shift by the reflectarray elements. The elements are realized in a lithographic process and are based on a conductor-backed coplanar waveguide patch antennas with a phase shifter attached to them. Prior the fabrication, the element is optimized based on full-wave simulations. Static 120-GHz offset-fed reflectarrays preceding the active ones have been fabricated and characterized at millimeter-wave near-field measurement range. With these prototypes, the feasibility of both the genetic algorithm and the fabrication process is proven successful, although in some part some iteration will still be required. The measured beam patterns of the reflectarray are in line with theoretical predictions given by the genetic algorithm when unidealities of the reflectarrays are taken into account.
    Original languageEnglish
    Title of host publicationProceedings
    Subtitle of host publication2012 7th European Microwave Integrated Circuit Conference, EuMIC2012
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages219-222
    Volume1
    ISBN (Electronic)978-2-87487-028-6
    ISBN (Print)978-1-4673-2302-4
    Publication statusPublished - 2012
    MoE publication typeA4 Article in a conference publication
    Event7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 - Amsterdam, Netherlands
    Duration: 29 Oct 201230 Oct 2012
    https://ieeexplore.ieee.org/xpl/conhome/6476772/proceeding (Proceedings)

    Conference

    Conference7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012
    Abbreviated titleEUMiC 2012
    CountryNetherlands
    CityAmsterdam
    Period29/10/1230/10/12
    Internet address

    Keywords

    • beam steering
    • microelectromechanical system
    • millimeter-wave
    • near-field measurements
    • reflectarray

    Fingerprint Dive into the research topics of 'Millimeter-wave reflectarray for beam-steering applications'. Together they form a unique fingerprint.

    Cite this