Mixer-based characterization of millimeter-wave and terahertz single-anode and antiparallel schottky diodes

K. Dahlberg, Tero Kiuru, J. Mallat, T. Närhi, A.V. Räisänen

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)

    Abstract

    This paper presents an alternative characterization method to the traditional characterization methods of the millimeter-wave and terahertz Schottky diodes. The diodes can be characterized based on the mixer operation (conversion loss and noise temperature) under comparable conditions. The tuning of the embedding impedances and the easy changing of the diode under test allow the comparison of different diodes in their actual operating environment. A fundamental mixer test jig and a subharmonic mixer test jig are designed for the characterization and comparison of different single-anode and antiparallel Schottky diodes, respectively, at 183 GHz. For the antiparallel diodes, the traditional capacitance extraction is not possible, thus alternative and additional characterization data is valuable. The diode manufacturers can exploit the mixer-based characterization to test the mixer operation of their diode and to reveal possible problems with the diode during the diode development process.
    Original languageEnglish
    Pages (from-to)552-559
    Number of pages8
    JournalIEEE Transactions on Terahertz Science and Technology
    Volume4
    Issue number5
    DOIs
    Publication statusPublished - 2014
    MoE publication typeA1 Journal article-refereed

    Fingerprint

    Schottky diodes
    Millimeter waves
    millimeter waves
    Anodes
    Diodes
    anodes
    diodes
    jigs
    Jigs
    noise temperature
    embedding
    capacitance
    tuning
    impedance
    Capacitance
    Tuning

    Keywords

    • millimeter waves
    • mixers
    • Schottky diodes
    • terahertz

    Cite this

    @article{5625d9eb912e40e29ada7062f1daf9f2,
    title = "Mixer-based characterization of millimeter-wave and terahertz single-anode and antiparallel schottky diodes",
    abstract = "This paper presents an alternative characterization method to the traditional characterization methods of the millimeter-wave and terahertz Schottky diodes. The diodes can be characterized based on the mixer operation (conversion loss and noise temperature) under comparable conditions. The tuning of the embedding impedances and the easy changing of the diode under test allow the comparison of different diodes in their actual operating environment. A fundamental mixer test jig and a subharmonic mixer test jig are designed for the characterization and comparison of different single-anode and antiparallel Schottky diodes, respectively, at 183 GHz. For the antiparallel diodes, the traditional capacitance extraction is not possible, thus alternative and additional characterization data is valuable. The diode manufacturers can exploit the mixer-based characterization to test the mixer operation of their diode and to reveal possible problems with the diode during the diode development process.",
    keywords = "millimeter waves, mixers, Schottky diodes, terahertz",
    author = "K. Dahlberg and Tero Kiuru and J. Mallat and T. N{\"a}rhi and A.V. R{\"a}is{\"a}nen",
    year = "2014",
    doi = "10.1109/TTHZ.2014.2330205",
    language = "English",
    volume = "4",
    pages = "552--559",
    journal = "IEEE Transactions on Terahertz Science and Technology",
    issn = "2156-342X",
    publisher = "IEEE Institute of Electrical and Electronic Engineers",
    number = "5",

    }

    Mixer-based characterization of millimeter-wave and terahertz single-anode and antiparallel schottky diodes. / Dahlberg, K.; Kiuru, Tero; Mallat, J.; Närhi, T.; Räisänen, A.V.

    In: IEEE Transactions on Terahertz Science and Technology, Vol. 4, No. 5, 2014, p. 552-559.

    Research output: Contribution to journalArticleScientificpeer-review

    TY - JOUR

    T1 - Mixer-based characterization of millimeter-wave and terahertz single-anode and antiparallel schottky diodes

    AU - Dahlberg, K.

    AU - Kiuru, Tero

    AU - Mallat, J.

    AU - Närhi, T.

    AU - Räisänen, A.V.

    PY - 2014

    Y1 - 2014

    N2 - This paper presents an alternative characterization method to the traditional characterization methods of the millimeter-wave and terahertz Schottky diodes. The diodes can be characterized based on the mixer operation (conversion loss and noise temperature) under comparable conditions. The tuning of the embedding impedances and the easy changing of the diode under test allow the comparison of different diodes in their actual operating environment. A fundamental mixer test jig and a subharmonic mixer test jig are designed for the characterization and comparison of different single-anode and antiparallel Schottky diodes, respectively, at 183 GHz. For the antiparallel diodes, the traditional capacitance extraction is not possible, thus alternative and additional characterization data is valuable. The diode manufacturers can exploit the mixer-based characterization to test the mixer operation of their diode and to reveal possible problems with the diode during the diode development process.

    AB - This paper presents an alternative characterization method to the traditional characterization methods of the millimeter-wave and terahertz Schottky diodes. The diodes can be characterized based on the mixer operation (conversion loss and noise temperature) under comparable conditions. The tuning of the embedding impedances and the easy changing of the diode under test allow the comparison of different diodes in their actual operating environment. A fundamental mixer test jig and a subharmonic mixer test jig are designed for the characterization and comparison of different single-anode and antiparallel Schottky diodes, respectively, at 183 GHz. For the antiparallel diodes, the traditional capacitance extraction is not possible, thus alternative and additional characterization data is valuable. The diode manufacturers can exploit the mixer-based characterization to test the mixer operation of their diode and to reveal possible problems with the diode during the diode development process.

    KW - millimeter waves

    KW - mixers

    KW - Schottky diodes

    KW - terahertz

    U2 - 10.1109/TTHZ.2014.2330205

    DO - 10.1109/TTHZ.2014.2330205

    M3 - Article

    VL - 4

    SP - 552

    EP - 559

    JO - IEEE Transactions on Terahertz Science and Technology

    JF - IEEE Transactions on Terahertz Science and Technology

    SN - 2156-342X

    IS - 5

    ER -