Model and Quality Driven Embedded Systems Engineering

Eila Ovaska, András Balogh, Sergio Campos, Adrian Noguero, András Pataricza, Kari Tiensyrjä, Josetxo Vicedo

Research output: Book/ReportReport

1 Citation (Scopus)


The world of embedded systems is broad and diverse, addressing a wide variety of application domains. Although technologically, the situation for embedded systems is still quite fragmented, platform-based engineering, reference designs and maturing system domains have effected great changes. However, the features of modern embedded systems are changing at such a rate that it is increasingly difficult for companies to bring new products to the market within acceptable time scales and still guarantee acceptable levels of operational quality. This report aims for its part to increase the convergence of views with regard to embedded systems technologies and engineering methods. The objective of this report is to introduce the methodology framework for model and quality driven embedded systems engineering. The framework is composed of three key artefacts, which provide the basis for building specific methodology instances. While instantiating this methodology framework, it has to be adapted to the needs and constraints of that specific application domain and development organisation. The first key artefact of the methodology framework is the process model, the Y-chart model. The second key artefact is the Unified Modelling Language (UML) adapted to embedded systems engineering with a specific profile. The third key artefact consists of a set of evaluation methods that have been selected for use in embedded system engineering. Within the conclusions, an initial integrated development environment is introduced for embedded systems engineering. The methods selected for the methodology framework have been validated in different application domains of embedded or/and software systems engineering areas.
Original languageEnglish
Place of PublicationEspoo
PublisherVTT Technical Research Centre of Finland
Number of pages211
ISBN (Electronic)978-951-38-7336-3
Publication statusPublished - 2009
MoE publication typeD4 Published development or research report or study

Publication series

SeriesVTT Publications


  • methodology
  • modelling
  • evaluation
  • quality
  • embedded systems engineering


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