The world of embedded systems is broad and diverse,
addressing a wide variety of application domains.
Although technologically, the situation for embedded
systems is still quite fragmented, platform-based
engineering, reference designs and maturing system
domains have effected great changes. However, the
features of modern embedded systems are changing at such
a rate that it is increasingly difficult for companies to
bring new products to the market within acceptable time
scales and still guarantee acceptable levels of
operational quality. This report aims for its part to
increase the convergence of views with regard to embedded
systems technologies and engineering methods.
The objective of this report is to introduce the
methodology framework for model and quality driven
embedded systems engineering. The framework is composed
of three key artefacts, which provide the basis for
building specific methodology instances. While
instantiating this methodology framework, it has to be
adapted to the needs and constraints of that specific
application domain and development organisation.
The first key artefact of the methodology framework is
the process model, the Y-chart model. The second key
artefact is the Unified Modelling Language (UML) adapted
to embedded systems engineering with a specific profile.
The third key artefact consists of a set of evaluation
methods that have been selected for use in embedded
system engineering. Within the conclusions, an initial
integrated development environment is introduced for
embedded systems engineering.
The methods selected for the methodology framework have
been validated in different application domains of
embedded or/and software systems engineering areas.
|Place of Publication||Espoo|
|Publisher||VTT Technical Research Centre of Finland|
|Number of pages||211|
|Publication status||Published - 2009|
|MoE publication type||D4 Published development or research report or study|
- embedded systems engineering