Model and Quality Driven Embedded Systems Engineering

Eila Ovaska, András Balogh, Sergio Campos, Adrian Noguero, András Pataricza, Kari Tiensyrjä, Josetxo Vicedo

    Research output: Book/ReportReportProfessional

    Abstract

    The world of embedded systems is broad and diverse, addressing a wide variety of application domains. Although technologically, the situation for embedded systems is still quite fragmented, platform-based engineering, reference designs and maturing system domains have effected great changes. However, the features of modern embedded systems are changing at such a rate that it is increasingly difficult for companies to bring new products to the market within acceptable time scales and still guarantee acceptable levels of operational quality. This report aims for its part to increase the convergence of views with regard to embedded systems technologies and engineering methods. The objective of this report is to introduce the methodology framework for model and quality driven embedded systems engineering. The framework is composed of three key artefacts, which provide the basis for building specific methodology instances. While instantiating this methodology framework, it has to be adapted to the needs and constraints of that specific application domain and development organisation. The first key artefact of the methodology framework is the process model, the Y-chart model. The second key artefact is the Unified Modelling Language (UML) adapted to embedded systems engineering with a specific profile. The third key artefact consists of a set of evaluation methods that have been selected for use in embedded system engineering. Within the conclusions, an initial integrated development environment is introduced for embedded systems engineering. The methods selected for the methodology framework have been validated in different application domains of embedded or/and software systems engineering areas.
    Original languageEnglish
    Place of PublicationEspoo
    PublisherVTT Technical Research Centre of Finland
    Number of pages211
    ISBN (Electronic)978-951-38-7336-3
    Publication statusPublished - 2009
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameVTT Publications
    PublisherVTT
    No.705
    ISSN (Print)1235-0621
    ISSN (Electronic)1455-0849

    Fingerprint

    Systems engineering
    Embedded systems
    Unified Modeling Language
    Software engineering
    Industry

    Keywords

    • methodology
    • modelling
    • evaluation
    • quality
    • embedded systems engineering

    Cite this

    Ovaska, E., Balogh, A., Campos, S., Noguero, A., Pataricza, A., Tiensyrjä, K., & Vicedo, J. (2009). Model and Quality Driven Embedded Systems Engineering. Espoo: VTT Technical Research Centre of Finland. VTT Publications, No. 705
    Ovaska, Eila ; Balogh, András ; Campos, Sergio ; Noguero, Adrian ; Pataricza, András ; Tiensyrjä, Kari ; Vicedo, Josetxo. / Model and Quality Driven Embedded Systems Engineering. Espoo : VTT Technical Research Centre of Finland, 2009. 211 p. (VTT Publications; No. 705).
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    Ovaska, E, Balogh, A, Campos, S, Noguero, A, Pataricza, A, Tiensyrjä, K & Vicedo, J 2009, Model and Quality Driven Embedded Systems Engineering. VTT Publications, no. 705, VTT Technical Research Centre of Finland, Espoo.

    Model and Quality Driven Embedded Systems Engineering. / Ovaska, Eila; Balogh, András; Campos, Sergio; Noguero, Adrian; Pataricza, András; Tiensyrjä, Kari; Vicedo, Josetxo.

    Espoo : VTT Technical Research Centre of Finland, 2009. 211 p. (VTT Publications; No. 705).

    Research output: Book/ReportReportProfessional

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    Ovaska E, Balogh A, Campos S, Noguero A, Pataricza A, Tiensyrjä K et al. Model and Quality Driven Embedded Systems Engineering. Espoo: VTT Technical Research Centre of Finland, 2009. 211 p. (VTT Publications; No. 705).