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Modeling, simulation and data fitting of the charge injected diodes (CID) for SLHC tracking applications

  • Zheng Li*
  • , V. Eremin
  • , J. Härkönen
  • , P. Luukka
  • , Eija Tuominen
  • , E. Tuovinen
  • , E. Verbitskaya
  • *Corresponding author for this work
  • Brookhaven National Laboratory
  • Ioffe Institute
  • University of Helsinki

Research output: Contribution to journalArticleScientificpeer-review

Abstract

Modeling and simulations have been performed for the charge injected diodes (CID) for the application in SLHC. MIP-induced current and charges have been calculated for segmented detectors with various radiation fluences, up to the highest SLHC fluence of 1 × 1016 neq/cm2. Although the main advantage of CID detectors is their virtual full depletion at any radiation fluence at a modest bias voltage (< 600 V), the simulation of CID and fitting to the existing data have shown that the CID operation mode also reduces the free carrier trapping, resulting in a much higher charge collection at the SLHC fluence than that in a standard Si detector. The reduction in free carrier trapping by almost one order of magnitude is due to the fact that the CID mode also pre-fills the traps, making them neutral and not active in trapping. It has been found that, electron traps can be pre-filled by injection of electrons from the n+ contact, and hole traps can be pre-filled by injection of holes from the p+ contact. The CID mode of detector operation can be achieved by a modestly low temperature of around -40°C, achievable by the proposed CO2 cooling for detector upgrades in SLHC. High charge collection comparable to the 3D electrode Si detectors makes the CID Si detector a valuable alternative for SLHC detectors for its much easier fabrication process.

Original languageEnglish
Pages (from-to)552-557
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume617
Issue number1-3
DOIs
Publication statusPublished - 11 May 2010
MoE publication typeA1 Journal article-refereed

Keywords

  • Charge collection
  • CID
  • Radiation hardness
  • Si detectors

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