Monolithically integratable broad-band anti-reflection stacks for Si photonics platforms

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Based on commonly used dielectric materials in Si processing platforms, multiple-layer anti-reflection stacks were designed and fabricated, with the main goal of highly efficient light coupling for Si waveguides over a wide wavelength range. Initial characterization results indicate that a <-20dB light reflection was successfully achieved over 1310-1550 nm wavelength range over the whole 150mm wafer. The fluctuation of reflection spectra over the whole wafer was observed to be only 1-2 dB, which guarantees the high yield and mass production capabilities for further applications.

Original languageEnglish
Title of host publicationIntegrated Optics
Subtitle of host publicationDevices, Materials, and Technologies XXVII
EditorsSonia M. Garcia-Blanco, Pavel Cheben
PublisherInternational Society for Optics and Photonics SPIE
ISBN (Electronic)9781510659537
DOIs
Publication statusPublished - 17 Mar 2023
MoE publication typeA4 Article in a conference publication
EventIntegrated Optics: Devices, Materials, and Technologies XXVII 2023 - San Francisco, United States
Duration: 30 Jan 20232 Feb 2023

Publication series

SeriesProceedings of SPIE - The International Society for Optical Engineering
Volume12424
ISSN0277-786X

Conference

ConferenceIntegrated Optics: Devices, Materials, and Technologies XXVII 2023
Country/TerritoryUnited States
CitySan Francisco
Period30/01/232/02/23

Keywords

  • anti-reflection
  • broadband
  • monolithic integration
  • optical coupling
  • optical waveguide
  • silicon photonics

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