The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The lower uncertainty specifications of a high end network analyzer were used as the basis for the analysis. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance characterization can be extracted with less than 4% error at low frequencies below 2–3GHz. Output capacitance is challenging because it can easily be 50% erroneous. Output resistance can be extracted with less than 20% error for a output real part range of 3Ω to 1kΩ.
|Pages (from-to)||244 - 247|
|Number of pages||4|
|Publication status||Published - 2004|
|MoE publication type||A1 Journal article-refereed|
|Event||20th Nordic Semiconductor Meeting, NSM20 - Tampere, Finland|
Duration: 25 Aug 2003 → 27 Aug 2003