MOSFET RF extraction uncertainties due to S parameter measurement errors

Jan Saijets, Markku Åberg

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)

Abstract

The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The lower uncertainty specifications of a high end network analyzer were used as the basis for the analysis. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance characterization can be extracted with less than 4% error at low frequencies below 2–3GHz. Output capacitance is challenging because it can easily be 50% erroneous. Output resistance can be extracted with less than 20% error for a output real part range of 3Ω to 1kΩ.
Original languageEnglish
Pages (from-to)244 - 247
Number of pages4
JournalPhysica Scripta
VolumeT114
DOIs
Publication statusPublished - 2004
MoE publication typeA1 Journal article-refereed
Event20th Nordic Semiconductor Meeting, NSM20 - Tampere, Finland
Duration: 25 Aug 200327 Aug 2003

Fingerprint

MOSFET
Measurement Error
field effect transistors
Capacitance
Uncertainty
output
Output
analyzers
capacitance
Equivalent Circuit
transconductance
Inaccurate
equivalent circuits
Low Frequency
specifications
Specification
low frequencies
Range of data
Resistance

Cite this

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title = "MOSFET RF extraction uncertainties due to S parameter measurement errors",
abstract = "The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The lower uncertainty specifications of a high end network analyzer were used as the basis for the analysis. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance characterization can be extracted with less than 4{\%} error at low frequencies below 2–3GHz. Output capacitance is challenging because it can easily be 50{\%} erroneous. Output resistance can be extracted with less than 20{\%} error for a output real part range of 3Ω to 1kΩ.",
author = "Jan Saijets and Markku {\AA}berg",
note = "Project code: T3SU00072",
year = "2004",
doi = "10.1088/0031-8949/2004/T114/062",
language = "English",
volume = "T114",
pages = "244 -- 247",
journal = "Physica Scripta",
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publisher = "Institute of Physics IOP",

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MOSFET RF extraction uncertainties due to S parameter measurement errors. / Saijets, Jan; Åberg, Markku.

In: Physica Scripta, Vol. T114, 2004, p. 244 - 247.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - MOSFET RF extraction uncertainties due to S parameter measurement errors

AU - Saijets, Jan

AU - Åberg, Markku

N1 - Project code: T3SU00072

PY - 2004

Y1 - 2004

N2 - The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The lower uncertainty specifications of a high end network analyzer were used as the basis for the analysis. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance characterization can be extracted with less than 4% error at low frequencies below 2–3GHz. Output capacitance is challenging because it can easily be 50% erroneous. Output resistance can be extracted with less than 20% error for a output real part range of 3Ω to 1kΩ.

AB - The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The lower uncertainty specifications of a high end network analyzer were used as the basis for the analysis. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance characterization can be extracted with less than 4% error at low frequencies below 2–3GHz. Output capacitance is challenging because it can easily be 50% erroneous. Output resistance can be extracted with less than 20% error for a output real part range of 3Ω to 1kΩ.

U2 - 10.1088/0031-8949/2004/T114/062

DO - 10.1088/0031-8949/2004/T114/062

M3 - Article

VL - T114

SP - 244

EP - 247

JO - Physica Scripta

JF - Physica Scripta

SN - 0031-8949

ER -