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MOSFET RF extraction uncertainties due to
S
parameter measurement errors
Jan Saijets
, Markku Åberg
Research output
:
Contribution to journal
›
Article
›
Scientific
›
peer-review
2
Citations (Scopus)
Overview
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Dive into the research topics of 'MOSFET RF extraction uncertainties due to
S
parameter measurement errors'. Together they form a unique fingerprint.
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Keyphrases
Measurement Error
100%
S-parameter Measurement
100%
MOSFET
100%
RF Extraction
100%
Input Resistance
50%
Low Uncertainty
50%
Real Part
50%
Parameter Extraction
50%
Network Analyzer
50%
Resistance Extraction
50%
Small-signal Model
50%
Vector Network Analyzer
50%
Transconductance
50%
Output Resistance
50%
RF MOSFET
50%
MOSFET Parameters
50%
Uncertainty Effect
50%
Output Capacitance
50%
Feedback Capacitance
50%
Capacitance Characterization
50%
INIS
errors
100%
extraction
100%
mosfet
100%
output
75%
capacitance
50%
feedback
25%
range
25%
signals
25%
specifications
25%
vectors
25%
equivalent circuits
25%
Engineering
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Scattering Parameters
100%
Measurement Error
100%
Network Analyzer
66%
Real Part
33%
Output Resistance
33%
Input Resistance
33%
Equivalent Circuit
33%