Multiscale surface roughness of bare soil

Terhikki Manninen; Markku Rantasuo; Thuy Le Toan; Malcolm Davidson; Francesco Mattia; Maurice Borgeaud

doi:10.1109/IGARSS.1998.691351

Multiscale surface roughness of bare soil

Terhikki Manninen, Markku Rantasuo, Thuy Le Toan, Malcolm Davidson, Francesco Mattia, Maurice Borgeaud

VTT Technical Research Centre of Finland

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

Up to very recently the remote sensing community has used for vertical and horizontal surface roughness a description based on single scale rms height and correlation length, but they do not characterise all the properties of natural surfaces that are relevant for scattering. These two parameters are not intrinsic properties of the surface, but they depend on the measurement length (outer scale) and the resolution (inner scale). The capability of studying pixel size surface statistics is thus important, since not a single surface can be proved to be stationary by measurements, because the results are affected by the inner and outer scales of the measurements. The objective of the present work has been to develop a realistic surface roughness description for natural surfaces like agricultural fields. The surface is described with the inclination angle obtained by linear regression of the surface and multiscale surface roughness on top of this inclination. The main idea of the multiscale surface roughness description is that the surface roughness is based on a superposition of various wavelengths.

Original language	English
Title of host publication	IGARSS '98: Sensing and Managing the Environment
Subtitle of host publication	1998 IEEE International Geoscience and Remote Sensing Symposium
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	1203-1206
ISBN (Print)	978-0-7803-4403-7
DOIs	https://doi.org/10.1109/IGARSS.1998.691351
Publication status	Published - 1998
MoE publication type	A4 Article in a conference publication
Event	1998 IEEE International Geoscience and Remote Sensing Symposium - Sheraton, Seattle, United States Duration: 6 Jul 1998 → 10 Jul 1998

Conference

Conference	1998 IEEE International Geoscience and Remote Sensing Symposium
Country/Territory	United States
City	Seattle
Period	6/07/98 → 10/07/98

Access to Document

10.1109/IGARSS.1998.691351

Cite this

@inproceedings{a6e377738a7840009bb30eb96b28c5b7,

title = "Multiscale surface roughness of bare soil",

abstract = "Up to very recently the remote sensing community has used for vertical and horizontal surface roughness a description based on single scale rms height and correlation length, but they do not characterise all the properties of natural surfaces that are relevant for scattering. These two parameters are not intrinsic properties of the surface, but they depend on the measurement length (outer scale) and the resolution (inner scale). The capability of studying pixel size surface statistics is thus important, since not a single surface can be proved to be stationary by measurements, because the results are affected by the inner and outer scales of the measurements. The objective of the present work has been to develop a realistic surface roughness description for natural surfaces like agricultural fields. The surface is described with the inclination angle obtained by linear regression of the surface and multiscale surface roughness on top of this inclination. The main idea of the multiscale surface roughness description is that the surface roughness is based on a superposition of various wavelengths.",

author = "Terhikki Manninen and Markku Rantasuo and {Le Toan}, Thuy and Malcolm Davidson and Francesco Mattia and Maurice Borgeaud",

year = "1998",

doi = "10.1109/IGARSS.1998.691351",

language = "English",

isbn = "978-0-7803-4403-7",

pages = "1203--1206",

booktitle = "IGARSS '98: Sensing and Managing the Environment",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "1998 IEEE International Geoscience and Remote Sensing Symposium ; Conference date: 06-07-1998 Through 10-07-1998",

}

Manninen, T, Rantasuo, M, Le Toan, T, Davidson, M, Mattia, F & Borgeaud, M 1998, Multiscale surface roughness of bare soil. in IGARSS '98: Sensing and Managing the Environment: 1998 IEEE International Geoscience and Remote Sensing Symposium. IEEE Institute of Electrical and Electronic Engineers, pp. 1203-1206, 1998 IEEE International Geoscience and Remote Sensing Symposium, Seattle, Washington, United States, 6/07/98. https://doi.org/10.1109/IGARSS.1998.691351

Multiscale surface roughness of bare soil. / Manninen, Terhikki; Rantasuo, Markku; Le Toan, Thuy et al.
IGARSS '98: Sensing and Managing the Environment: 1998 IEEE International Geoscience and Remote Sensing Symposium. IEEE Institute of Electrical and Electronic Engineers, 1998. p. 1203-1206.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Multiscale surface roughness of bare soil

AU - Manninen, Terhikki

AU - Rantasuo, Markku

AU - Le Toan, Thuy

AU - Davidson, Malcolm

AU - Mattia, Francesco

AU - Borgeaud, Maurice

PY - 1998

Y1 - 1998

N2 - Up to very recently the remote sensing community has used for vertical and horizontal surface roughness a description based on single scale rms height and correlation length, but they do not characterise all the properties of natural surfaces that are relevant for scattering. These two parameters are not intrinsic properties of the surface, but they depend on the measurement length (outer scale) and the resolution (inner scale). The capability of studying pixel size surface statistics is thus important, since not a single surface can be proved to be stationary by measurements, because the results are affected by the inner and outer scales of the measurements. The objective of the present work has been to develop a realistic surface roughness description for natural surfaces like agricultural fields. The surface is described with the inclination angle obtained by linear regression of the surface and multiscale surface roughness on top of this inclination. The main idea of the multiscale surface roughness description is that the surface roughness is based on a superposition of various wavelengths.

AB - Up to very recently the remote sensing community has used for vertical and horizontal surface roughness a description based on single scale rms height and correlation length, but they do not characterise all the properties of natural surfaces that are relevant for scattering. These two parameters are not intrinsic properties of the surface, but they depend on the measurement length (outer scale) and the resolution (inner scale). The capability of studying pixel size surface statistics is thus important, since not a single surface can be proved to be stationary by measurements, because the results are affected by the inner and outer scales of the measurements. The objective of the present work has been to develop a realistic surface roughness description for natural surfaces like agricultural fields. The surface is described with the inclination angle obtained by linear regression of the surface and multiscale surface roughness on top of this inclination. The main idea of the multiscale surface roughness description is that the surface roughness is based on a superposition of various wavelengths.

U2 - 10.1109/IGARSS.1998.691351

DO - 10.1109/IGARSS.1998.691351

M3 - Conference article in proceedings

SN - 978-0-7803-4403-7

SP - 1203

EP - 1206

BT - IGARSS '98: Sensing and Managing the Environment

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 1998 IEEE International Geoscience and Remote Sensing Symposium

Y2 - 6 July 1998 through 10 July 1998

ER -

Multiscale surface roughness of bare soil

Abstract

Conference

Access to Document

Fingerprint

Cite this